Gamma Ray Imaging: Technology and Applications
Du, Junwei, Iniewski
- 出版商: Springer
- 出版日期: 2024-08-13
- 售價: $2,480
- 貴賓價: 9.5 折 $2,356
- 語言: 英文
- 頁數: 247
- 裝訂: Quality Paper - also called trade paper
- ISBN: 3031306686
- ISBN-13: 9783031306686
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相關主題
商品描述
- Covers a broad range of topics, including an introduction to novel gamma imaging technologies;
- Includes in-depth analysis on how to optimize X-ray detection;
- Discusses the analysis of electronics for gamma-ray detection.
商品描述(中文翻譯)
本書將為讀者提供有關伽馬射線成像檢測技術領域中一些最新進展的良好概述,特別是與新應用相關的部分。書中將包含技術和醫療成像及工業測試應用的綜合章節。該書將深入回顧來自該領域世界領先專家的研究主題。伽馬射線信號轉換為類比/數位值的過程將在某些章節中進行探討。有些章節還將提供有關伽馬射線影像感測器的CMOS晶片的回顧。
- 涵蓋廣泛的主題,包括新型伽馬成像技術的介紹;
- 包含有關如何優化X射線檢測的深入分析;
- 討論伽馬射線檢測的電子學分析。
作者簡介
Junwei Du is a scientist at the Department of Biomedical Engineering, University of California at Davis (UC Davis). He obtained his B.S. degree in Applied Physics (2005) and Ph.D. degree in Electronic Science and Technology (2010) from the University of Science and Technology of China. His research focuses on developing high-resolution and high-sensitivity Positron Emission Tomography (H2RS-PET) for biomedical imaging. Dr. Du has published over 50 peer-reviewed research papers in the biomedical imaging field that cover detectors, electronics, system of PET.
Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed the development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press, and Springer. He is a frequently invited speaker and has consulted for multiple organizations internationally.
作者簡介(中文翻譯)
Junwei Du 是加州大學戴維斯分校(UC Davis)生物醫學工程系的科學家。他於2005年獲得中國科學技術大學應用物理學學士學位,並於2010年獲得電子科學與技術博士學位。他的研究專注於開發高解析度和高靈敏度的正電子發射斷層掃描(H2RS-PET)技術,用於生物醫學影像。杜博士在生物醫學影像領域發表了超過50篇經過同行評審的研究論文,涵蓋了探測器、電子學和PET系統等主題。
Krzysztof (Kris) Iniewski 目前在位於加拿大不列顛哥倫比亞省的 Redlen Technologies Inc. 擔任研發管理職務。在 Redlen 工作的15年間,他負責管理醫療影像和安全應用中高度整合的CZT探測器產品的開發。在加入 Redlen 之前,Kris 曾在 PMC-Sierra、阿爾伯塔大學、SFU、UBC 和多倫多大學擔任各種管理和學術職位。Iniewski 博士在國際期刊和會議上發表了超過150篇研究論文,並持有20多項在美國、加拿大、法國、德國和日本授予的國際專利。他為 Wiley、劍橋大學出版社、麥格勞-希爾、CRC出版社和施普林格編寫和編輯了幾本書籍。他經常受邀演講,並為多個國際組織提供諮詢服務。