Cdte and Cdznte Materials: Material Properties and Applications
Iniewski, Kris
- 出版商: Springer
- 出版日期: 2024-08-22
- 售價: $5,530
- 貴賓價: 9.5 折 $5,254
- 語言: 英文
- 頁數: 302
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3031645200
- ISBN-13: 9783031645204
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商品描述
This book provides readers with a good overview of some of most recent advances in the field of CdTe and CdZnTe detector technology for medical imaging, industrial testing and security scanning, especially as it pertains to new applications. There will be a good mixture of general chapters in both technology and applications inthe X-ray testing. The book will have an in-depth review of the research topics from leading world specialists in the field. The conversion of the X-ray and gamma-ray signal into analogue/digital value will be covered in some chapters. Some would also provide a review of CMOS chips for CdTe and CdZnTe image sensors. This book serves as an excellent reference for people already working in the field as well as for people wishing to enter it.
商品描述(中文翻譯)
本書為讀者提供了關於CdTe和CdZnTe探測器技術在醫療影像、工業測試和安全掃描領域的一些最新進展的良好概述，特別是針對新應用的部分。書中將包含技術和X射線測試應用的多個一般章節。該書將深入回顧來自該領域領先專家的研究主題。某些章節將涵蓋X射線和伽馬射線信號轉換為類比/數位值的過程。部分章節還將提供有關CdTe和CdZnTe影像感測器的CMOS晶片的回顧。本書對於已在該領域工作的人士以及希望進入該領域的人士來說，都是一本極佳的參考資料。
作者簡介
Krzysztof (Kris) Iniewski is a director of development architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.
Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
作者簡介(中文翻譯)
Krzysztof (Kris) Iniewski 是位於加拿大不列顛哥倫比亞省的 Redlen Technologies Inc. 的開發架構與應用總監。在 Redlen 工作的 15 年期間，他負責管理醫療影像和安全應用中高度整合的 CdZnTe 探測器產品的開發。在加入 Redlen 之前，Kris 曾在 PMC-Sierra、阿爾伯塔大學、SFU、UBC 和多倫多大學擔任各種管理和學術職位。
Iniewski 博士在國際期刊和會議上發表了超過 150 篇研究論文。他擁有 25 項以上在美國、加拿大、法國、德國和日本獲得的國際專利。他為 Wiley、劍橋大學出版社、麥格勞-希爾、CRC Press 和 Springer 編寫和編輯了超過 75 本書籍。他是經常受邀的演講者，並為多個國際組織提供諮詢服務。
