Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations (Hardcover)
暫譯: 韌性 VLSI 電路的分析與設計:減輕軟錯誤與製程變異 (精裝版)
Rajesh Garg
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商品描述
This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.
商品描述(中文翻譯)
本書描述了韌性 VLSI 電路的設計。由於輻射粒子撞擊和製程變異的有害影響,VLSI 設計最近變得更加具有挑戰性。本書提出了分析這些問題對 VLSI 電路電氣行為影響的演算法,以及減輕這些問題影響的電路設計技術。