Single-Event Effects, from Space to Accelerator Environments: Analysis, Prediction and Hardening by Design
Aguiar, Ygor Quadros de, Wrobel, Frédéric, Autran, Jean-Luc
- 出版商: Springer
- 出版日期: 2024-10-18
- 售價: $2,450
- 貴賓價: 9.5 折 $2,328
- 語言: 英文
- 頁數: 141
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3031717228
- ISBN-13: 9783031717222
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商品描述
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described.
Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA.
- Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies
- Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies
- Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels
- Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context
This is an open access book.
商品描述(中文翻譯)
本書描述了在惡劣環境中運作的電子元件中,輻射引起的失效機制的基本概念,例如在太空任務或粒子加速器中。除了提供不同輻射環境的動態和組成的廣泛概述外,作者還討論了被稱為單事件效應(SEEs)的失效機制,以及專門的失效建模和預測方法。此外,還描述了在物理佈局和電路層面上的新型輻射抗干擾設計(RHBD)技術。
對於這一領域的新手讀者,將學習粒子相互作用物理學和電子抗干擾設計的基本概念,從輻射環境的組成和動態及其對電子元件的影響,到元件的認證和抗干擾設計。經驗豐富的讀者將會享受對於近年來在輻射效應建模、模擬和分析方面的最新進展的全面討論,特別是最近歐洲項目RADSAGA的成果。
- 描述了電子學中輻射效應的基本概念和最先進的抗干擾方法
- 涉及被稱為單事件效應(SEEs)的失效機制,以及專門的失效建模和預測方法
- 揭示了在物理佈局和電路層面上的新型輻射抗干擾設計(RHBD)技術
- 提供了讀者第一本在輻射效應背景下廣泛包含粒子加速器應用的書籍
這是一本開放存取的書籍。
作者簡介
Y. Q. Aguiar received a B.Sc. degree in Automation Engineering from the Universidade Federal do Rio Grande, Brazil, in 2015, and a M.Sc. degree in Microelectronics from the Universidade Federal do Rio Grande do Sul, Brazil, in 2017, and a Ph.D. degree in Electronics Engineering from the Université de Montpellier, France, in 2020. During his thesis, he was a Marie Sklodowska-Curie Fellow in the RADSAGA Innovative Training Network. He concentrated his studies on the application of prediction methodologies to evaluate radiation effects in electronics and the exploration of novel radiation hardening by design techniques. He was awarded the 2020 Paul Phelps Award from the IEEE Nuclear and Plasma Sciences Society (NPSS) during the Nuclear and Space Radiation Effects Conference (NSREC). Currently, he is a senior research fellow at the European Organization for Nuclear Research (CERN), in Geneva, Switzerland. His current activities are focused on the assessment of the radiation environments within the Large Hadron Collider (LHC) complex for the application of Radiation Hardness Assurance (RHA) methodologies. He has also been pointed as a technical and scientific support officer in the RADNEXT European Research Infrastructure. His main research topics includes the analysis and modeling of radiation effects in electronics, device variability effects, hardening techniques for digital circuit design, radiation hardness assurance and dosimetry.
F. Wrobel, after a university degree in nuclear physics and instrumentation, performed his doctoral thesis at the University Montpellier 2, under the direction of Professor Jean-Marie Palau, on the issue of the reliability of SRAM memories. In 2002, he joined the University of Nice Sophia Antipolis first as Assistant Professor (ATER) and then the following year as Associate Professor. He worked on the radiation-matter interaction for medical applications (dosimetry) and electronic (reliability). In 2008, he joined the RADIAC team in the University of Montpellier 2 and since then he has been working on the development of tools for predicting error rates in electronic components as well as the contamination of component materials by alpha emitters. Frédéric Wrobel received his accreditation to supervise researches (HDR) in December 2008, and later, in 2010, he was awarded the Great Price of electronics "General Ferrié" for his works on nuclear physics codes and their original and innovative validations by stratospheric balloon flights. Additionally, he was awarded the Price "Chercheur d'Avenir" (Region Languedoc Roussillon) for his work on radiation in atmosphere. He is author and co-author of over 180 articles in journals and international conferences. In 2011, he became head of the specialty of Master EEA "Dependability Engineering Space". His field of expertise is radiation-induced single-event upset and he works both at radiation-matter interaction and electronic devices levels. In particular, he developed predictive tools that estimate the sensitivity of devices to radiation (neutrons, protons, ions). In 2012, Frédéric Wrobel became a junior member of Institut Universitaire de France (IUF) and since 2014 he is a Full Professor.
J.L. Autran received the Materials Science and Engineering Degree and the Ph.D. Degree in Microelectronics, both from the National Institute of Applied Sciences (INSA) of Lyon in 1992 and 1994 respectively. In 1999, he was awarded the accreditation to supervise research (HDR) from University Claude Bernard Lyon-1. Since 2000, he has been Full Professor of physics at Aix-Marseille University. From 2003 to 2008, he was member of the Institut Universitaire de France (IUF) and from 2017 to 2023, he was the Head of the Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP Laboratory). Currently, he is the Head of the Institut de Physique de Rennes. His current research works concern the physics of single event effects in microelectronics devices and circuits, natural radiation environments, physics modeling and numerical Monte Carlo simulation. Jean-Luc Autran authored or co-authored more than 300 papers in international technical journals and refereed conferences, 1 book, 20 invited conferences, 17 book chapters and edited 13 international conference proceedings. In 2011, he was elected Fellow of the French electricity, electronics and information and communication technology Society "for his work concerning the effects of cosmic and atmospheric radiation on advanced micro and nanoelectronics components and circuits".
R. G. Alía is part of the "Radiation to Electronics" (R2E) project at CERN, which he leads since 2018. After having studied nuclear and high-energy physics in the Complutense University in Madrid (Spain), he started his career in radiation effects as a Young Graturate Trainee at the European Space Agency, in the Netherlands. From there, he moved to completing his PhD with CERN and the University of Montpellier, focusing on the effect ofhighly energetic particles on Single Event Effects in the LHC accelerator. During this period, he was recognized with the "Best Student Paper" award in RADECS 2012, and the Paul Phelps Award in 2015. Since then, he has kept a strong involvement in radiation effects research with, focusing on high-energy accelerator applications, and has co-authored more than 75 publications in peer reviewed journals. He has also co-authored a RADECS Short Course, has been session chair at NSREC and RADECS, and is currently technical chair for RADECS 2021. Recently he was elected Junior Member-at-Large of the Radiation Effects Steering Group (RESG). At CERN, his main task is that of managing the R2E project, which is responsible for all aspects linked to radiation effects in the LHC accelerator and its injector chair, with the mandate of ensuring its successful operation with regards to stochastic failures and lifetime degradation induced by radiation. The project, which is composed of more than 50 members, embeds a rich variety of activities and expertise, ranging from the monitoring and calculation of radiation levels, through the operation of CERN radiation facilities, and up to radiation effects testing at both component and system level. Rubén is also coordinating the RADSAGA Marie Curie PhD network since 2017, and led the RADNEXT proposal for creating a radiation test infrastructure network in Europe, which was accepted for funding and is currently in its implementation phase.
作者簡介(中文翻譯)
Y. Q. Aguiar於2015年獲得巴西里約格朗德聯邦大學的自動化工程學士學位,2017年獲得巴西南里約格朗德聯邦大學的微電子碩士學位,2020年獲得法國蒙彼利埃大學的電子工程博士學位。在其論文期間,他是RADSAGA創新培訓網絡的Marie Sklodowska-Curie研究員。他專注於預測方法在評估電子設備輻射影響的應用,以及探索新穎的設計輻射抗性技術。他在2020年核與等離子體科學學會(NPSS)舉辦的核與太空輻射效應會議(NSREC)上獲得了保羅·菲爾普斯獎。目前,他是瑞士日內瓦歐洲核子研究組織(CERN)的高級研究員。他目前的工作重點是評估大型強子對撞機(LHC)複合體內的輻射環境,以應用輻射抗性保證(RHA)方法。他還被指派為RADNEXT歐洲研究基礎設施的技術和科學支持官員。他的主要研究主題包括電子設備中的輻射效應分析與建模、設備變異性效應、數位電路設計的抗輻射技術、輻射抗性保證和劑量測量。
F. Wrobel在獲得核物理與儀器的學位後,在蒙彼利埃大學2進行博士論文,指導教授為Jean-Marie Palau,研究主題為SRAM記憶體的可靠性。2002年,他加入尼斯索非亞安提波利斯大學,最初擔任助理教授(ATER),隨後於次年成為副教授。他的研究涉及輻射與物質的相互作用,應用於醫療(劑量測量)和電子(可靠性)。2008年,他加入蒙彼利埃大學2的RADIAC團隊,自此以來,他一直致力於開發預測電子元件錯誤率的工具,以及研究元件材料被α射線發射體污染的問題。Frédéric Wrobel於2008年12月獲得研究指導資格(HDR),並於2010年因其在核物理代碼及其通過平流層氣球飛行進行的原創和創新驗證的研究,獲得電子學「General Ferrié」大獎。此外,他因在大氣輻射方面的研究獲得「Chercheur d'Avenir」獎(朗格多克-魯西永地區)。他是180多篇期刊和國際會議文章的作者和合著者。2011年,他成為EEA碩士專業「太空可靠性工程」的負責人。他的專業領域是輻射引起的單事件擾動,並在輻射與物質的相互作用及電子設備層面上進行研究。特別是,他開發了預測工具,以估算設備對輻射(中子、質子、離子)的敏感性。2012年,Frédéric Wrobel成為法國大學研究所(IUF)的初級成員,自2014年起成為全職教授。
J.L. Autran於1992年和1994年分別獲得里昂應用科學國立學院(INSA)的材料科學與工程學位及微電子博士學位。1999年,他獲得里昂克勞德·伯納大學的研究指導資格(HDR)。自2000年以來,他一直是艾克斯-馬賽大學的物理全職教授。2003年至2008年,他是法國大學研究所(IUF)的成員,2017年至2023年,他擔任普羅旺斯微電子材料研究所(IM2NP實驗室)的負責人。目前,他是雷恩物理研究所的負責人。他目前的研究工作涉及物理學。