商品描述
This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.
The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.
This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.
商品描述(中文翻譯)
本書探討了 VLSI（超大規模積體電路）在電子系統的安全、可靠和可依賴設計與運作中所扮演的新角色。
本書分為三個部分。第一部分作為這一重要主題的總體介紹，描述了電子系統的設計與測試，特別強調了可依賴性工程，該工程同時評估故障的有害後果及其控制成本。本部分還描述了相關的研究項目「可依賴的 VLSI 系統」，編輯和作者在該項目中參與了 8 年。第二部分針對 VLSI 作為關鍵系統元件的可依賴性所面臨的各種威脅，包括時間依賴性退化、設備特性變化、電離輻射、電磁干擾、設計錯誤和篡改，並討論了應對這些威脅的技術。第三部分詳細闡述了在機器人和車輛控制、數據處理、雲環境中的存儲以及異構無線電信等應用中，確保可依賴性的設計和測試技術。
本書旨在作為工程師在設計和測試 VLSI 系統時的參考，特別關注可依賴性。它也可以作為研究生課程的教科書。對於從社會和產業經濟角度關心可依賴系統的讀者，本書中的討論也將帶來益處。
