Architecture Design for Soft Errors
暫譯: 軟錯誤的架構設計

Shubu Mukherjee

  • 出版商: Morgan Kaufmann
  • 出版日期: 2008-02-22
  • 售價: $3,410
  • 貴賓價: 9.5$3,240
  • 語言: 英文
  • 頁數: 360
  • 裝訂: Hardcover
  • ISBN: 0123695295
  • ISBN-13: 9780123695291
  • 海外代購書籍(需單獨結帳)

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商品描述

This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques.

TABLE OF CONTENTS
Chapter 1: Introduction
Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation
Chapter 3: Architectural Vulnerability Analysis
Chapter 4: Advanced Architectural Vulnerability Analysis
Chapter 5: Error Coding Techniques
Chapter 6: Fault Detection via Redundant Execution
Chapter 7: Hardware Error Recovery
Chapter 8: Software Detection and Recovery

* Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them

商品描述(中文翻譯)

本書提供了針對軟錯誤問題的架構技術的全面描述。它涵蓋了軟錯誤的定量分析新方法,以及新穎且具成本效益的架構技術來減輕這些問題。為了讓讀者更好地理解更廣泛的問題定義和解決方案空間,本書還深入探討了軟錯誤的物理學,並回顧了當前的電路和軟體減輕技術。

目錄
第1章:介紹
第2章:裝置和電路層級的建模、測量和減輕
第3章:架構脆弱性分析
第4章:進階架構脆弱性分析
第5章:錯誤編碼技術
第6章:透過冗餘執行進行故障檢測
第7章:硬體錯誤恢復
第8章:軟體檢測和恢復

* 提供量化輻射引起的軟錯誤影響所需的方法論,以及保護免受這些影響的最先進技術。