Advanced Verification Techniques: A Systemc Based Approach for Successful Tapeout
暫譯: 進階驗證技術:基於 SystemC 的成功流片方法

Leena Singh, Leonard Drucker

  • 出版商: Springer
  • 出版日期: 2004-06-08
  • 售價: $6,930
  • 貴賓價: 9.5$6,584
  • 語言: 英文
  • 頁數: 376
  • 裝訂: Hardcover
  • ISBN: 140207672X
  • ISBN-13: 9781402076725
  • 海外代購書籍(需單獨結帳)

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商品描述

Description

"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and that the costs associated with functional verification are now outweighing the costs of chip design. To cope with these challenges engineers are increasingly relying on new design and verification methodologies and languages.  Transaction-based design and verification, constrained random stimulus generation, functional coverage analysis, and assertion-based verification are all techniques that advanced design and verification teams routinely use today. Engineers are also increasingly turning to design and verification models based on C/C++ and SystemC in order to build more abstract, higher performance hardware and software models and to escape the limitations of RTL HDLs. This new book, Advanced Verification Techniques, provides specific guidance for these advanced verification techniques. The book includes realistic examples and shows how SystemC and SCV can be applied to a variety of advanced design and verification tasks."
                                                                                     - Stuart Swan

 
Table of contents
Introduction.- Verification Process.- Using SCV for Verification.- Functional Verification Testplan.- Testbench Concepts using SystemC.- Verification Methodology.-Regression/Setup and Run.- Functional Coverage.- Dynamic Memory Modeling.- Post Synthesis Gate Simulation.- Appendices.

商品描述(中文翻譯)

**描述**
隨著晶片尺寸和複雜度的指數增長,功能驗證的挑戰已成為電子產業中的一個關鍵問題。現在常聽到在功能驗證過程中遺漏的邏輯錯誤是晶片重製的最常見原因,而與功能驗證相關的成本已經超過晶片設計的成本。為了應對這些挑戰,工程師越來越依賴新的設計和驗證方法論及語言。基於交易的設計和驗證、受限隨機刺激生成、功能覆蓋分析以及基於斷言的驗證都是當前先進設計和驗證團隊常用的技術。工程師們也越來越多地轉向基於 C/C++ 和 SystemC 的設計和驗證模型,以構建更抽象、更高效能的硬體和軟體模型,並擺脫 RTL HDL 的限制。本書《先進驗證技術》提供了這些先進驗證技術的具體指導。書中包含現實的範例,並展示如何將 SystemC 和 SCV 應用於各種先進的設計和驗證任務。
- Stuart Swan

**目錄**
引言 - 驗證過程 - 使用 SCV 進行驗證 - 功能驗證測試計畫 - 使用 SystemC 的測試平台概念 - 驗證方法論 - 回歸/設置和運行 - 功能覆蓋 - 動態記憶體建模 - 合成後閘級模擬 - 附錄。