Photomask Fabrication Technology
暫譯: 光掩模製造技術
Benjamin G. Eynon, Banqiu Wu
- 出版商: McGraw-Hill Education
- 出版日期: 2005-08-01
- 售價: $5,860
- 貴賓價: 9.5 折 $5,567
- 語言: 英文
- 頁數: 500
- 裝訂: Hardcover
- ISBN: 0071445633
- ISBN-13: 9780071445634
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商品描述
Description:
Photomasks are defect-free optical templates -- the printing masters for the fabrication of integrated circuits (ICs). When IC feature sizes fall below the exposure tool’s source wavelength, photomask fabrication becomes difficult: very strict mask critical dimension (CD) and feature placement specifications, intensive capital equipment investment, unique raw materials and applications, and special expertise requirements for photomask fabrication technologists are necessary to fabricate modern microelectronics. Thus the rapid recent growth of the field and the need for this book. This text details the science and technology of industrial photomask production, including fundamental principles, industrial production flows, technological evolution and development, and state of the art technologies. Focusing on industrial applications rather than pure science, the goal of the book is to provide a comprehensive reference for any engineer developing microelectronic manufacturing processes
Table of Contents:
Introduction
Data Preparation and Design
Pattern Generation
Pattern Transfer
Photomask Metrology
Defect Control and Finishing
Inspection, Repair, and Cleaning
Resolution Enhancement Techniques
Water Fabrication Issues
Future Developments
Appendices
References
商品描述(中文翻譯)
描述:
光罩是無缺陷的光學模板——集成電路(IC)製造的印刷母版。當IC特徵尺寸低於曝光工具的光源波長時,光罩的製造變得困難:需要非常嚴格的光罩關鍵尺寸(CD)和特徵放置規範、密集的資本設備投資、獨特的原材料和應用,以及對光罩製造技術專家的特殊專業知識。因此,該領域的快速增長和本書的需求。這本書詳細介紹了工業光罩生產的科學和技術,包括基本原則、工業生產流程、技術演變和發展,以及最先進的技術。本書專注於工業應用而非純科學,目標是為任何開發微電子製造過程的工程師提供全面的參考。
目錄:
引言
數據準備與設計
圖案生成
圖案轉移
光罩計量
缺陷控制與後處理
檢查、修復與清潔
解析度增強技術
水製造問題
未來發展
附錄
參考文獻