VLSI Design and Test: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers (Communications in Computer and Information Science)
暫譯: VLSI 設計與測試：第 22 屆國際研討會 VDAT 2018，印度馬杜賴，2018 年 6 月 28-30 日，修訂選擇論文（計算機與資訊科學通訊）
商品描述
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
商品描述(中文翻譯)
本書為第22屆國際VLSI設計與測試研討會（VDAT 2018）的經過審查的會議論文集，該會議於2018年6月在印度馬杜賴舉行。共提交了231篇論文，經過仔細審查後，最終選出了39篇完整論文和11篇短文，並附上8篇海報論文。這些論文依主題分為以下幾個部分：數位設計；類比與混合信號設計；硬體安全；微生物流體學；VLSI測試；類比電路與裝置；片上網路（NoC）；記憶體；量子計算與片上網路；感測器與介面。
