VLSI Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
暫譯: VLSI 設計與測試：第 23 屆國際研討會 Vdat 2019，印度印多爾，2019 年 7 月 4-6 日，修訂選定論文
Sengupta, Anirban, Dasgupta, Sudeb, Singh, Virendra
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商品描述
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
商品描述(中文翻譯)
本書為2019年7月在印度印多爾舉行的第23屆國際VLSI設計與測試研討會（VDAT 2019）的經過審稿的會議論文集。
這63篇完整論文是從199篇投稿中仔細審核和選出的。論文按照主題分為以下幾個部分：類比與混合信號設計；計算架構與安全性；硬體設計與優化；低功耗VLSI與記憶體設計；設備建模；以及硬體實現。
