Electron Nano-Imaging: Basics of Imaging and Diffraction for Tem and Stem
暫譯: 電子納米成像：透射電子顯微鏡與掃描透射電子顯微鏡的成像與衍射基礎

Tanaka, Nobuo

Electron Nano-Imaging: Basics of Imaging and Diffraction for Tem and Stem
  • 出版商: Springer
  • 出版日期: 2024-08-03
  • 售價: $4,160
  • 貴賓價: 9.5 折 $3,952
  • 語言: 英文
  • 頁數: 384
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 4431569391
  • ISBN-13: 9784431569398

    • 海外代購書籍(需單獨結帳)

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商品描述

In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers.

商品描述(中文翻譯)

在本書的第二版中，2017年出版的第一版大部分章節已進行修訂，並補充了最近在電子顯微鏡領域的進展，例如差分相位對比（DPC）掃描透射電子顯微鏡（STEM）、稀疏編碼影像處理和量子電子顯微鏡等詳細內容。本書以教科書的風格解釋了透射電子顯微鏡（TEM）和掃描透射電子顯微鏡（STEM）中的成像和衍射基礎。書中重點解釋了TEM和STEM的電子顯微成像，而不在主要文本中包含有關晶體衍射、波光學、電子透鏡以及散射和衍射理論的基本知識，這些內容在附錄中單獨解釋。基於傅立葉變換理論的全面解釋，使本書在高解析度電子顯微鏡的其他進階資源中具有獨特性。通過本教科書，讀者能夠理解TEM和STEM成像理論的本質，而不會被各種與電子顯微鏡相關的知識所分散注意力。本書中最新的信息，特別是關於STEM的成像細節和像差修正，對於當今的研究生和剛開始職業生涯的專業人士來說，具有全球價值。

作者簡介

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC) and Nagoya Industrial Science Research Institute (NISRI). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.

作者簡介(中文翻譯)

田中信夫博士是名古屋大學可持續材料與系統研究所（IMaSS）的指定教授，同時也是日本精密陶瓷中心（JFCC）和名古屋產業科學研究所（NISRI）的兼任高級研究員。他於1978年在名古屋大學應用物理系獲得博士學位，並成為該系的助理教授。1983年至1985年間，他在亞利桑那州立大學擔任訪問學者，與已故的J. Cowley教授學習。1999年，他通過副教授的任命成為名古屋大學應用物理系的正教授。2001年，他轉至名古屋大學綜合科學與工程研究中心（CIRSE），該中心於2004年更名為生態頂尖科學研究所（ESI），並於2015年更名為IMaSS。他於2012年至2015年擔任該研究所的所長。2015年至2017年，他還擔任日本顯微鏡學會（JSM）的會長。

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