Electron Crystallography: Electron Microscopy and Electron Diffraction (Hardcover)
暫譯: 電子晶體學:電子顯微鏡與電子衍射 (精裝版)
Xiaodong Zou, Sven Hovmoller, Peter Oleynikov
- 出版商: Oxford University
- 出版日期: 2011-12-01
- 售價: $1,500
- 貴賓價: 9.8 折 $1,470
- 語言: 英文
- 頁數: 344
- 裝訂: Hardcover
- ISBN: 0199580200
- ISBN-13: 9780199580200
下單後立即進貨 (約5~7天)
商品描述
In the modern world of ever smaller devices and nanotechnology, electron crystallography emerges as the most important method capable of determining the structure of minute objects down to the size of individual atoms. Crystals of only a few millionths of a millimetre are studied. This is the first textbook explaining how this is done. Great attention is given to symmetry in crystals and how it manifests itself in electron microscopy and electron diffraction, and how this symmetry can be determined and taken advantage of in achieving improved electron microscopy images and solving crystal structures from electron diffraction patterns.
Theory and practice are combined; experimental images, diffraction patterns, formulae and numerical data are discussed in parallel, giving the reader a complete understanding of what goes on inside the "black boxes" of computer programs.
This up-to-date textbook contains the newest techniques in electron crystallography, including detailed descriptions and explanations of the recent remarkable successes in determining the very complex structures of zeolites and intermetallics. The controversial issue of whether there is phase information present in electron micrsocopy images or not is also resolved once and for all.
The extensive appendices include computer labs which have been used at various courses at Stockholm University and international schools in electron crystallography, with applications to the textbook. Students can download image processing programs and follow these lab instructions to get a hands-on experience of electron crystallography.
商品描述(中文翻譯)
在現代越來越小的設備和納米技術的世界中,電子晶體學成為了能夠確定微小物體結構的重要方法,甚至可以達到單個原子的大小。研究的晶體僅有幾百萬分之一毫米的大小。這是第一本解釋如何做到這一點的教科書。書中對晶體的對稱性給予了高度重視,並探討了其在電子顯微鏡和電子衍射中的表現,以及如何確定和利用這種對稱性來改善電子顯微鏡圖像和從電子衍射圖案中解決晶體結構。
理論與實踐相結合;實驗圖像、衍射圖案、公式和數據並行討論,使讀者能夠全面理解計算機程序中的“黑箱”內部運作。
這本最新的教科書包含了電子晶體學中的最新技術,包括對最近在確定非常複雜的分子篩和金屬間化合物結構方面的顯著成功的詳細描述和解釋。關於電子顯微鏡圖像中是否存在相位信息的爭議問題也得到了一勞永逸的解決。
廣泛的附錄包括在斯德哥爾摩大學和國際電子晶體學學校的各種課程中使用的計算機實驗室,並與教科書的應用相結合。學生可以下載圖像處理程序,並按照這些實驗室指導進行操作,以獲得電子晶體學的實踐經驗。