Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
暫譯: 掃描穿透電子顯微鏡：材料科學應用的先進表徵方法
Bruma, Alina
- 出版商: CRC
- 出版日期: 2020-12-21
- 售價: $4,910
- 貴賓價: 9.5 折 $4,665
- 語言: 英文
- 頁數: 164
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 0367197367
- ISBN-13: 9780367197360
海外代購書籍(需單獨結帳)
商品描述
Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures.
This book:
- Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data
- Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors
- Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management
- Focuses on supervised and unsupervised machine learning for electron microscopy
- Discusses open data formats, community-driven software, and data repositories
- Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets
- Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation
- Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials
This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science-derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
商品描述(中文翻譯)
《掃描傳輸電子顯微鏡學》專注於討論高保真定量環形暗場（ADF）數據記錄的最新方法。它展示了機器學習在電子顯微鏡中的應用，以及在使用掃描傳輸電子顯微鏡（STEM）分析材料時，圖像處理和數據解釋的最新進展，特別是對於那些難以分析的材料。它還強調了記錄和解釋大型電子衍射數據集以分析納米結構的策略。
本書：
- 討論了在高保真定量ADF數據記錄中現有的實驗設計方法
- 介紹了最常見的閃爍體-光電倍增管ADF探測器，並分析其優缺點。提出了最小化這些探測器引入的誤差的策略，以及處理殘餘誤差的途徑
- 討論了可靠的多幀成像實踐，以及它在電子劑量或劑量率管理中所帶來的好處和新的實驗機會
- 專注於電子顯微鏡的監督式和非監督式機器學習
- 討論開放數據格式、社群驅動的軟體和數據庫
- 提出在全球和局部尺度上處理信息的方法，並討論改善多維數據集的存儲、傳輸、分析和解釋的途徑
- 提供通過儀器的新發展在解析度極限下研究材料的可能性範圍
- 建議使用電子衍射技術對敏感納米材料進行定量結構表徵的方法，並描述收集此類材料電子衍射圖樣的策略
本書幫助材料科學、化學、物理及相關領域的學術界、研究人員和業界專業人士理解並應用計算機科學衍生的分析方法，以解決有關材料性質的數據分析和解釋問題。
作者簡介
Dr. Alina Bruma received her PhD degree in Nanoscale Physics from The University of Birmingham, UK in 2013. Dr. Bruma completed several postdoctoral stages at the Laboratory of Crystallography and Materials Science (CRISMAT-CNRS) France, University of Texas at San Antonio, USA and The National Institute of Standards and Technology, USA before moving to the American Institute of Physics Publishing in 2019. Her research has been focused on the study of crystalline structure of materials and the determination of their structure-property relationship using transmission electron microscopy and electron diffraction. Dr Bruma is also the Chairman of The Electron Diffraction sub-committee at the International Center for Diffraction Data (ICDD).
作者簡介(中文翻譯)
阿莉娜·布魯瑪博士於2013年在英國伯明翰大學獲得納米尺度物理學的博士學位。布魯瑪博士在法國晶體學與材料科學實驗室（CRISMAT-CNRS）、美國德克薩斯州聖安東尼奧大學以及美國國家標準與技術研究所完成了幾個博士後階段，並於2019年轉至美國物理學會出版部。她的研究專注於材料的晶體結構研究，以及利用透射電子顯微鏡和電子衍射確定其結構-性質關係。布魯瑪博士也是國際衍射數據中心（ICDD）電子衍射小組委員會的主席。
