Scanning Probe Microscopy: The Lab on a Tip
Meyer, Ernst, Bennewitz, Roland, Hug, Hans J.
- 出版商: Springer
- 出版日期: 2021-06-01
- 售價: $3,450
- 貴賓價: 9.5 折 $3,278
- 語言: 英文
- 頁數: 322
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3030370887
- ISBN-13: 9783030370886
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相關分類:
奈米科技 Nano、微電子學 Microelectronics、物理學 Physics
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作者簡介
Ernst Meyer is Professor of Physics at the University of Basel and an expert in the field of atomic force microscopy. He has chaired European programmes for the study of nanotribology and is member of the executive board of the Swiss Nanoscience Institute. His research focuses on scientific questions in the fields of nanomechanics and nanoelectronics.
Roland Bennewitz is Professor of Physics at Saarland University and group leader at the Leibniz Institute for New Materials (INM) in Saarbrücken, Germany. His main areas of expertise are high-resolution friction force microscopy, force microscopy of liquid-solid interfaces, and control of adhesion and friction by macromolecular functionalization or ionic liquids. He has chaired international conferences such are the Gordon Research Conference in Tribology 2014 and a Beilstein Symposium on Molecular Mechanisms in Tribology in 2016. He currently serves as on the Editorial Board of the Journal Tribology Letters.
Hans Josef Hug is Professor of Physics at the University of Basel and laboratory head at the Empa - Swiss Federal Laboratories for Materials Testing and Research in Dübendorf, near Zürich, where he leads the laboratory for Magnetic and Functional Thin Films. In 2003 he and his team received the Swiss Technology Award for the development of high resolution and quantitative magnetic force microscopy. His main areas of expertise are magnetism and magnetic thin film systems and scanning force microscopy with a particular emphasis on magnetic force microscopy.