Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
暫譯: 凱爾文探針力顯微術：從單一電荷檢測到裝置特性化

Sadewasser, Sascha, Glatzel, Thilo

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
  • 出版商: Springer
  • 出版日期: 2019-01-04
  • 售價: $8,810
  • 貴賓價: 9.5 折 $8,370
  • 語言: 英文
  • 頁數: 521
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 3030092984
  • ISBN-13: 9783030092986

    • 海外代購書籍(需單獨結帳)

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商品描述

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.

In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics.

It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.


商品描述(中文翻譯)

本書提供了對凱爾文探針力顯微術方法及其多樣性的全面介紹，包括技術細節。它還概述了最近的發展和眾多應用，涵蓋從半導體材料、納米結構和設備到亞分子及原子尺度的靜電學。

在過去的25年中，凱爾文探針力顯微術從少數掃描探針顯微術專家所應用的專門技術，發展成為全球眾多研究和開發團隊所使用的工具。本書是編輯們之前著作《凱爾文探針力顯微術：測量和補償靜電力》的續集，介紹了新的和互補的主題。

本書旨在面向廣泛的讀者群體，從本科生到實驗室技術人員以及對該領域新手的掃描探針顯微術專家。

作者簡介

Sascha Sadewasser has been the Principal Investigator of the Laboratory for Nanostructured Solar Cells at INL - International Iberian Nanotechnology Laboratory (Portugal) since 2011. In 1999, he received his PhD from Washington University in St. Louis (USA). After a post-doc at Hahn-Meitner Institut Berlin and a Ramón y Cajal fellowship at the CNM in Barcelona (Spain), he was a group leader at the Helmholtz-Zentrum Berlin (Germany). Sascha's research focuses on the development of nanostructures for and of chalcopyrite materials for the improvement of solar cells. He is an expert on scanning probe microscopy, and specifically Kelvin probe force microscopy, applied to semiconductor and solar cell research. His work has provided important insights into the physics of grain boundaries in polycrystalline Cu(in, Ga)Se2 thin-film solar cells. He has published over 80 peer-reviewed papers and 5 book chapters, and has been granted 3 patents. He is also a member of several scientific committees and evaluation boards.

Thilo Glatzel is leader of the force microscopy group which is part of the research group from Prof. E. Meyer at the University of Basel. He is co-author of 115 international publications, contributed several book chapters, co-edited the first volume of the book on Kelvin probe force microscopy (KPFM), and has more than 100 contributions to international scientific conferences. During his dissertation at the Helmholtz-Zentrum Berlin he investigated interfaces and surfaces of chalcopyrite thin film solar cells based on Cu(Ga, In)(S, Se)2 absorber materials by KPFM. His work is now focused on the development of instruments and measurement techniques for high resolution scanning probe microscopy and the analysis of molecules and insulating and semiconducting surfaces at the nanometer scale. The expertise of the group is clearly focused on the nanoscale analysis and preparation of highly ordered surfaces down to the molecular and atomic scale, however with a focus on optoelectronic processes.

作者簡介(中文翻譯)

Sascha Sadewasser 自 2011 年以來一直擔任國際伊比利亞奈米技術實驗室 (INL - International Iberian Nanotechnology Laboratory，葡萄牙) 的奈米結構太陽能電池實驗室的首席研究員。他於 1999 年在美國聖路易斯華盛頓大學獲得博士學位。在柏林哈恩-邁特納研究所 (Hahn-Meitner Institut Berlin) 完成博士後研究，並在西班牙巴塞隆納的國家微技術中心 (CNM) 獲得 Ramón y Cajal 獎學金後，他成為德國亥姆霍茲中心 (Helmholtz-Zentrum Berlin) 的研究小組負責人。Sascha 的研究重點是開發奈米結構和銅礦石材料，以改善太陽能電池。他是掃描探針顯微鏡的專家，特別是在半導體和太陽能電池研究中應用的凱爾文探針力顯微鏡 (Kelvin probe force microscopy, KPFM)。他的研究為多晶 Cu(in, Ga)Se2 薄膜太陽能電池中晶界的物理學提供了重要的見解。他已發表超過 80 篇經過同行評審的論文和 5 章書籍，並獲得 3 項專利。他還是幾個科學委員會和評估委員會的成員。

Thilo Glatzel 是巴塞爾大學 E. Meyer 教授研究小組中力學顯微鏡小組的負責人。他是 115 篇國際出版物的共同作者，貢獻了幾章書籍，並共同編輯了凱爾文探針力顯微鏡 (KPFM) 書籍的第一卷，並在國際科學會議上發表了超過 100 篇的貢獻。在亥姆霍茲中心柏林的博士論文中，他通過 KPFM 研究了基於 Cu(Ga, In)(S, Se)2 吸收材料的銅礦石薄膜太陽能電池的界面和表面。他目前的工作重點是開發高解析度掃描探針顯微鏡的儀器和測量技術，以及在奈米尺度上分析分子和絕緣及半導體表面。該小組的專業知識明確集中在奈米尺度的分析和高度有序表面的準備，直至分子和原子尺度，但重點在於光電過程。

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