買這商品的人也買了...
-
高頻通訊電路設計$600$588 -
Quantum Transport : Atom to Transistor$5,960$5,662 -
數位積體電路分析與設計 (Analysis and Design of Digital Integrated Circuits)$650$585 -
半導體元件概論 (Fundamentals of Semiconductor Devices)$780$764 -
The Physics And Modeling of Mosfets (International Series on Advances in Solid State Electronics) (International Series on Advances in Solid State Electronics and Technology (Asset)) (Hardcover)$1,500$1,470 -
$1,230Microelectronic Circuits: Analysis and Design, 2/e (IE-Paperback) -
C++ Primer Plus, 6/e (中文版) (C++ Primer Plus, 6/e (Developer's Library))$780$616 -
Semiconductor Process Reliability in Practice (Hardcover)$5,570$5,292 -
Quantum Mechanics (2 vol. set) (Paperback)$9,340$8,873 -
圖解組合語言, 2/e$520$406 -
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield (Hardcover)$4,510$4,285 -
Nanoelectronic Circuit Design (Hardcover)$6,930$6,584 -
Robust SRAM Designs and Analysis (Hardcover)$6,400$6,080 -
Design of Analog CMOS Integrated Circuits, 2/e (IE-Paperback)$1,600$1,568 -
Gravitation (Hardcover)$2,500$2,450 -
積體電路測試實務, 2/e$300$270 -
Electric Circuits, 11/e (GE-Paperback)$1,560$1,529 -
$1,744Physics of Semiconductor Devices, 4/e (Hardcover) -
射頻電路設計 — 理論與應用, 2/e$474$450 -
演算法, 4/e$460$451 -
A Course of Pure Mathematics, 3/e (Paperback)$1,290$1,226 -
普通化學分章試題解析 (上), 9/e (適用: 後西醫．後中醫．私醫聯招)$680$612 -
普通化學分章試題解析 (下), 9/e (適用: 後西醫．後中醫．私醫聯招)$680$612 -
量子力學概論 (原書第3版)$888$844
相關主題
商品描述
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
商品描述(中文翻譯)
《CMOS 測試與評估：物理觀點》是一本綜合性資料，提供對 CMOS 產品測試和數據分析方法的整體視角，涵蓋電路對 MOSFET 特性的敏感度、矽技術製程變異的影響、嵌入式測試結構和感測器的應用、產品良率以及產品在其壽命期間的可靠性。本書還涵蓋統計數據分析和可視化技術、測試設備和 CMOS 產品規格，並檢視產品在其全電壓、溫度和頻率範圍內的行為。
