Semiconductor Memories: Technology, Testing, and Reliability (Hardcover)

Ashok K. Sharma

  • 出版商: IEEE
  • 出版日期: 2002-09-10
  • 售價: $7,830
  • 貴賓價: 9.5$7,439
  • 語言: 英文
  • 頁數: 480
  • 裝訂: Hardcover
  • ISBN: 0780310004
  • ISBN-13: 9780780310001
  • 相關分類: 半導體
  • 已絕版

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Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.