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商品描述
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
商品描述(中文翻譯)
半導體記憶體深入探討了測試設計、容錯性、故障模式與機制，以及篩選和驗證方法，包括：
* 記憶體單元結構和製造技術。
* 特定應用的記憶體和架構。
* 記憶體設計、故障建模和測試演算法、限制和權衡。
* 太空環境、輻射抗性處理過程和設計技術，以及輻射測試。
* 用於千兆位元儲存的記憶體堆疊和多晶片模組。
