Gallium Nitride Power Devices
暫譯: 氮化鎵功率元件
- 出版商: Pan Stanford Publish
- 出版日期: 2017-06-27
- 售價: $5,250
- 貴賓價: 9.5 折 $4,988
- 語言: 英文
- 頁數: 308
- 裝訂: Hardcover
- ISBN: 981477409X
- ISBN-13: 9789814774093
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相關分類:
半導體、材料科學 Meterials、物理學 Physics
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商品描述
GaN is considered the most promising material candidate in next-generation power device applications, owing to its unique material properties, for example, bandgap, high breakdown field, and high electron mobility. Therefore, GaN power device technologies are listed as the top priority to be developed in many countries, including the United States, the European Union, Japan, and China.
This book presents a comprehensive overview of GaN power device technologies, for example, material growth, property analysis, device structure design, fabrication process, reliability, failure analysis, and packaging. It provides useful information to both students and researchers in academic and related industries working on GaN power devices.
GaN wafer growth technology is from Enkris Semiconductor, currently one of the leading players in commercial GaN wafers. Chapters 3 and 7, on the GaN transistor fabrication process and GaN vertical power devices, are edited by Dr. Zhihong Liu, who has been working on GaN devices for more than ten years. Chapters 2 and 5, on the characteristics of polarization effects and the original demonstration of AlGaN/GaN heterojunction field-effect transistors, are written by researchers from Southwest Jiaotong University. Chapters 6, 8, and 9, on surface passivation, reliability, and package technologies, are edited by a group of researchers from the Southern University of Science and Technology of China.
商品描述(中文翻譯)
GaN 被認為是下一代功率器件應用中最具潛力的材料候選者,這得益於其獨特的材料特性,例如帶隙、高擊穿場和高電子遷移率。因此,GaN 功率器件技術在許多國家(包括美國、歐盟、日本和中國)被列為優先發展的重點。
本書提供了 GaN 功率器件技術的全面概述,例如材料生長、特性分析、器件結構設計、製造過程、可靠性、故障分析和封裝。它為在學術界和相關行業從事 GaN 功率器件研究的學生和研究人員提供了有用的信息。
GaN 晶圓生長技術來自 Enkris Semiconductor,目前是商業 GaN 晶圓的領先企業之一。第三章和第七章關於 GaN 晶體管製造過程和 GaN 垂直功率器件,由在 GaN 器件領域工作超過十年的劉志宏博士編輯。第二章和第五章關於極化效應的特性以及 AlGaN/GaN 異質結場效應晶體管的原始示範,則由來自西南交通大學的研究人員撰寫。第六章、第八章和第九章關於表面鈍化、可靠性和封裝技術,由來自中國南方科技大學的一組研究人員編輯。