Theory and Practice of Thermal Transient Testing of Electronic Components (Hardcover)
暫譯: 電子元件熱瞬態測試的理論與實務 (精裝版)

Rencz, Marta

Theory and Practice of Thermal Transient Testing of Electronic Components (Hardcover)

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商品描述

This book discusses all of the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details, and then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions of the measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are discussed in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics, and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.

商品描述(中文翻譯)

本書討論了熱瞬態測試的所有主要方面，這是當今電子元件熱特性評估最重要的方法。本書首先介紹了從測量結果創建結構函數的理論背景，並提供數學細節，然後展示該方法如何用於熱合格、結構完整性測試、確定材料參數以及模擬模型的校準。為了幫助初學者進行熱瞬態測試，書中討論了測量的一般實用問題。針對各種電子元件（如矽二極體、雙極性晶體管、MOS晶體管、IGBT元件、電阻器、電容器、寬帶隙材料和LED）進行測量的特殊問題和技巧，書中也詳細討論了各種使用案例。本書將使讀者能夠對任何新型電子元件進行熱瞬態測試，並提供理解該方法所提供的機會和限制所需的理論細節。本書將成為實踐工程師、學生和研究人員的重要參考資料。

作者簡介

​Márta Rencz, PhD, is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master degrees in electrical engineering and a PhD from the Technical University of Budapest, Hungary, the Doctor of Science degree from The Hungarian Academy of Science, and the Doctor Honoris Causa Degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modelling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology including thermal test, characterization, and analysis of semiconductor devices and packages. She is Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.

作者簡介(中文翻譯)

​Márta Rencz 博士是布達佩斯科技經濟大學電子元件系的教授及前系主任。Rencz 博士同時擔任西門子業務部門 Mentor 的研究主任。她在匈牙利布達佩斯科技大學獲得電機工程的學士及碩士學位，並取得博士學位，此外還獲得匈牙利科學院的科學博士學位及塔林科技大學的榮譽博士學位。她最新的研究興趣包括集成電路 (IC) 和微機電系統 (MEMS) 的熱性質研究、熱感測器、熱測試、熱模擬、多物理場模型生成及電熱模擬。Rencz 博士因其在熱模型方面的研究成果獲得哈維·羅斯頓卓越獎 (Harvey Rosten Award of Excellence)，並因其對熱瞬態測試的科學及學術界的貢獻，特別是在半導體設備及封裝的熱計量、測試、特性化及分析方面的工作，獲得美國機械工程師學會 (ASME) 艾倫·克勞斯熱管理獎 (Allan Krauss Thermal Management Medal)。她是多個國際會議及研討會的程序委員會成員，並擔任多本領先科學期刊特刊的客座編輯。她已發表超過 350 篇技術論文，報導其理論及實踐成果。

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