Theory and Practice of Thermal Transient Testing of Electronic Components

Rencz, Marta, Farkas, Gábor, Poppe, András

  • 出版商: Springer
  • 出版日期: 2024-01-24
  • 售價: $3,560
  • 貴賓價: 9.5$3,382
  • 語言: 英文
  • 頁數: 385
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 3030861767
  • ISBN-13: 9783030861766
  • 海外代購書籍(需單獨結帳)

商品描述

This book discusses the significant aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book presents the theoretical background of creating structure functions from the measured results with mathematical details. It then shows how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and calibrating simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The particular problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide bandgap materials, and LEDs, are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers.

商品描述(中文翻譯)

本書討論了熱暫態測試的重要方面,這是當今最重要的電子熱特性測試方法。本書介紹了從測量結果中創建結構函數的理論背景,並提供了數學細節。然後,本書展示了如何將該方法應用於熱驗證、結構完整性測試、確定材料參數和校準模擬模型。本書討論了一般實際測量問題,以幫助初學者進行熱暫態測試。本書詳細介紹了使用各種電子元件進行測量的特定問題和技巧,例如矽二極管、雙極性晶體管、MOS晶體管、IGBT器件、電阻器、電容器、寬禁帶材料和LED等,並提供了各種使用案例的幫助。這本實用手冊將使讀者能夠對任何新型電子產品進行熱暫態測試,並提供了理解該方法所提供的機會和限制的理論細節。本書將成為實踐工程師、學生和研究人員的寶貴參考資料。

作者簡介

Márta Rencz, Ph.D., is a Professor and former Head of the Department of Electron Devices at the Budapest University of Technology and Economics. Dr. Rencz also holds a Research Director position with Mentor, a Siemens Business. She received her undergraduate and master's degrees in electrical engineering and a Ph.D. from the Technical University of Budapest, Hungary, a Doctor of Science degree from The Hungarian Academy of Science, and a Doctor Honoris Causa degree from the Technical University of Tallinn. Her latest research interests include the thermal investigation of ICs and MEMS, thermal sensors, thermal testing, thermal simulation, multiphysics model generation, and electro-thermal simulation. Dr. Rencz received the Harvey Rosten Award of Excellence for her research results in thermal modeling and the ASME Allan Krauss Thermal Management Medal for her contributions to the scientific and academic world of thermal transient testing, in particular, her work on thermal metrology, including thermal test, characterization, and analysis of semiconductor devices and packages. She is a Program Committee member for several international conferences and workshops and a guest editor of special issues at leading scientific journals. She has published her theoretical and practical results in more than 350 technical papers.

Gábor Farkas, Ph.D., received his MSc in electrical engineering in 1976 and his Ph.D. in 1981 at the Budapest University of Technology and Economics, Hungary, specializing in technical physics. Since then, Dr. Farkas has worked in various fields of microelectronics, from device design to circuit testing. He was visiting scholar at several European universities. His current research focus is on testing high-power devices. He has published his research results in over 100 technical papers.
András Poppe, Ph.D., received his MSc in electrical engineering in 1986 and his Ph.D. in 1996 at the Budapest University of Technology and Economics, Hungary, where he currently works as a professor. In 2019 he obtained a Doctor of the MTA degree from the Hungarian Academy of Science. Dr. Poppe's research interest is modeling and testing devices in microelectronics, focusing on LEDs. He is actively working in various standardization committees to help standardize testing devices in electronics. He has published his research results in over 200 technical papers.

作者簡介(中文翻譯)

Márta Rencz博士是布達佩斯科技與經濟大學電子元件系的教授和前系主任。Rencz博士同時擔任西門子旗下Mentor公司的研究總監職位。她在匈牙利布達佩斯科技大學獲得了電機工程學士和碩士學位,並在那裡獲得了博士學位。她還獲得了匈牙利科學院的科學博士學位和塔林科技大學的榮譽博士學位。她目前的研究興趣包括集成電路和微機電系統的熱特性研究、熱傳感器、熱測試、熱模擬、多物理模型生成和電熱模擬。Rencz博士因其在熱建模方面的研究成果獲得了Harvey Rosten卓越研究獎,並因其對熱瞬態測試的科學和學術貢獻,特別是在熱計量學方面的工作,獲得了ASME Allan Krauss熱管理獎。她是多個國際會議和研討會的計劃委員會成員,並擔任領先科學期刊的特刊客座編輯。她已在350多篇技術論文中發表了她的理論和實踐成果。

Gábor Farkas博士於1976年在布達佩斯科技與經濟大學獲得電機工程碩士學位,並於1981年獲得博士學位,專攻技術物理學。此後,Farkas博士在微電子的各個領域工作,從器件設計到電路測試。他曾在多所歐洲大學擔任訪問學者。他目前的研究重點是測試高功率器件。他已在100多篇技術論文中發表了他的研究成果。

András Poppe博士於1986年在布達佩斯科技與經濟大學獲得電機工程碩士學位,並於1996年獲得博士學位。他目前在該大學擔任教授職位,並於2019年獲得匈牙利科學院的MTA博士學位。Poppe博士的研究興趣是微電子器件的建模和測試,尤其是LED。他積極參與各種標準化委員會的工作,以幫助標準化電子設備的測試。他已在200多篇技術論文中發表了他的研究成果。