Integrated Circuit Test Engineering: Modern Techniques (Paperback)
暫譯: 集成電路測試工程:現代技術

Ian A. Grout

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Description

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.

Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about:

• fabrication processes;

• a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use;

• how to design for testability;

• fault simulation;

• automatic test equipment and

• the economics of testing.

From a practical perspective, the text includes:

• A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry.

• An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL.

• A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments.

Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.

商品描述(中文翻譯)

**描述**

將近六十年前,第一個成功的晶體管示範標誌著微電子學新時代的來臨。隨著微電子電路的複雜性和功能速度不斷增加,現在的電路中包含數千萬個晶體管,這要求在開發和生產過程中進行適當且嚴謹的測試工程活動。測試工程必須與微電子設計更緊密地交織在一起。對於任何希望從事集成電路設計或製造任何階段的學生來說,了解電路測試工程至關重要。

《集成電路測試工程》採取三管齊下的方法——從傳統測試、設計和製造的角度來處理測試工程——概括了當前的主題。在介紹基本測試規則到技術趨勢的背景後,讀者將學習到:

• 製造過程;

• 一系列多樣且完整的詳細測試和程序,旨在教會您所需的所有測試以及如何選擇使用哪一種(或多種);

• 如何設計以便於測試;

• 故障模擬;

• 自動測試設備;

• 測試的經濟學。

從實際的角度來看,該文本包括:

• 一系列的實例和練習,並附有組織良好的參考資料和書目,以幫助進一步的研究。

• 介紹各種軟體,如 MATLAB® 和 Spice,解釋它們在測試中的使用,以及 IEEE 標準硬體描述語言 Verilog®-HDL 和 VHDL 的應用。

• 一系列基於可從 springeronline.com 自由下載的材料的實驗,指導您構建適用於 MS Windows PC 的硬體測試裝置(功能、原理圖和印刷電路板佈局),並使用 Visual Basic 程式來驅動實驗。

《集成電路測試工程》提供了對模擬、數位和混合信號集成電路測試工程的全面且啟發性的介紹。這本書是高年級本科生和研究生電子工程學生的寶貴實用學習工具,也是他們導師的優秀教學資源,並且對於實踐中的電子工程師來說也是一本有用的指南。

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