Advanced Production Testing of RF, SoC, and SiP Devices
暫譯: 射頻、系統單晶片及系統封裝裝置的進階生產測試
Joe Kelly, Michael D. Engelhardt
- 出版商: Artech House Publish
- 出版日期: 2007-01-11
- 售價: $4,310
- 貴賓價: 9.5 折 $4,095
- 語言: 英文
- 頁數: 326
- 裝訂: Hardcover
- ISBN: 158053709X
- ISBN-13: 9781580537094
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商品描述
Description
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers you a comprehensive understanding of advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing and the peripheral testing needs and equipment that are critical to your work involving semiconductor devices. The book covers the key measurement concepts you need to understand for your varied projects and helps you explain these concepts to management to aid in the reduction of project cost, time, and resources. Moreover, you find practical information on important associated topics that have never been presented in a single reference before, including load boards (DIBs), contactors, and handlers.
Based on real-world experience and packed with time-saving equations, this in-depth volume provides you with detailed discussions in a wide range of essential areas, from applied tests for RF and SOC Devices and advances in these devices, to applications, calibration, and test costs. The book serves as an excellent complement to Production Testing of RF & System-on-Chip Devices for Wireless Communications (Artech House, 2004).
Introduction. Production Testing Equipment. Applied Tests for RF and SOC Devices. Advances in Testing RF and SOC Devices. Applications. Calibration. Cost of Test. Load Boards. Test Sockets and Contractors. Handlers. Wafer Probing.
商品描述(中文翻譯)
描述
本書匯集了業界領先公司和備受推崇的專家的寶貴意見,提供您對RF(射頻)、SiP(系統封裝)和SoC(系統單晶片)生產測試及其周邊測試需求和設備的全面理解,這些都是您在半導體設備工作中至關重要的。本書涵蓋了您在各種項目中需要理解的關鍵測量概念,並幫助您向管理層解釋這些概念,以協助降低項目的成本、時間和資源。此外,您還可以找到有關重要相關主題的實用資訊,這些主題在以往的參考資料中從未集中呈現過,包括負載板(DIBs)、接觸器和處理器。
基於實際經驗並充滿節省時間的方程式,本書深入探討了從RF和SoC設備的應用測試及其進展,到應用、校準和測試成本等一系列重要領域。本書是《無線通信RF與系統單晶片設備的生產測試》(Artech House, 2004)的極佳補充。
目錄
引言。生產測試設備。RF和SoC設備的應用測試。RF和SoC設備測試的進展。應用。校準。測試成本。負載板。測試插座和接觸器。處理器。晶圓探測。