Testing Complex and Embedded Systems (Hardcover)
暫譯: 測試複雜與嵌入式系統 (精裝版)

Kim H. Pries, Jon M. Quigley

  • 出版商: CRC
  • 出版日期: 2010-12-08
  • 售價: $4,880
  • 貴賓價: 9.5$4,636
  • 語言: 英文
  • 頁數: 319
  • 裝訂: Hardcover
  • ISBN: 1439821402
  • ISBN-13: 9781439821404
  • 相關分類: 嵌入式系統
  • 海外代購書籍(需單獨結帳)

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商品描述

Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the corrective work being performed in a rush and at the last minute.

 

Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing.

 

 

  • Details how to manage multiple test hardware and software deliveries
  • Examines the contradictory perspectives of testing—including ordered/ random, structured /unstructured, bench/field, and repeatable/non repeatable
  • Covers essential planning activities prior to testing, how to scope the work, and how to reach a successful conclusion
  • Explains how to determine when testing is complete

 

Where you find organizations that are successful at product development, you are likely to find groups that practice disciplined, strategic, and thorough testing. Tapping into the authors’ decades of experience managing test groups in the automotive industry, this book provides the understanding to help ensure your organization joins the likes of these groups.

商品描述(中文翻譯)

許多企業將系統級測試視為開發工作中的最後一環,而不是應該在整個開發過程中整合的工具。因此,測試團隊經常在產品發布前執行關鍵測試計劃,導致許多修正工作在匆忙和最後一刻進行。

本書《測試複雜和嵌入式系統》提出了改進測試覆蓋率的組合方法,詳細介紹了幫助您簡化測試並在問題發生之前識別問題的技術,包括使用六西格瑪進行的加速測試和探索性測試方法。該文本並不針對特定產品或設計屬性的測試連續性,而是專注於邊界條件。通過檢查系統和軟體測試,解釋了如何使用模擬和仿真來補充測試。

- 詳細說明如何管理多個測試硬體和軟體交付
- 檢視測試的矛盾觀點,包括有序/隨機、結構化/非結構化、實驗室/現場,以及可重複/不可重複
- 涵蓋測試前的基本規劃活動,如何界定工作範圍,以及如何達成成功的結論
- 解釋如何確定測試何時完成

在成功的產品開發組織中,您可能會發現那些實踐有紀律、戰略性和徹底測試的團隊。利用作者在汽車行業管理測試團隊的數十年經驗,本書提供了幫助確保您的組織能夠加入這些團體的理解。