Advances in Imaging and Electron Physics: Volume 229
Hawkes, Peter W., Hÿtch, Martin
- 出版商: Academic Press
- 出版日期: 2024-04-04
- 售價: $8,540
- 貴賓價: 9.5 折 $8,113
- 語言: 英文
- 頁數: 88
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 0443296480
- ISBN-13: 9780443296482
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相關分類:
物理學 Physics
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相關主題
商品描述
Linac Transmission Electron Microscope, Volume 229 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more.
商品描述(中文翻譯)
《Linac Transmission Electron Microscope, Volume 229》是《Advances in Imaging and Electron Physics》系列中的一本書。該系列將兩個長期連載的期刊《Advances in Electronics and Electron Physics》和《Advances in Optical and Electron Microscopy》合併在一起。本書的章節包括使用FE-TEM表徵納米材料性質、冷場發射電子源：從更高亮度到超快束流、每個電子都重要：朝著像差優化和像差校正的電子源發展等內容。
