Advanced VLSI Design and Testability Issues
暫譯: 高級 VLSI 設計與可測試性問題
Tripathi, Suman Lata, Saxena, Sobhit, Mohapatra, Sushanta Kumar
商品描述
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book.
This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2-5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10-13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14-18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC's structure and function, which makes it much more difficult to reverse engineer.
商品描述(中文翻譯)
這本書不僅為對 VLSI 感興趣的人提供深入的知識，還廣泛探討了其在不同領域的應用，包括影像處理和生物醫學。對基本概念的深刻理解使您能夠開發新的應用面向，而這本書使用簡單的語言來解釋這些概念，讓這一點得到了很好的照顧。在 VLSI 世界中，硬體描述語言的重要性不容忽視，因為設計如此密集和複雜的電路是無法在沒有它們的情況下完成的。本書使用 Verilog 和 VHDL 語言進行設計。當前高性能集成電路（IC）的需求，包括低功耗設備和新興材料，這些材料在實現新功能方面可以發揮非常重要的作用，是本書中最有趣的部分。在這個納米技術時代，VLSI 電路的測試變得比電路的設計更為關鍵。故障模擬算法的角色得到了很好的解釋，而使用 Verilog 實現這一點是本書的關鍵方面。
本書共分為 20 章。第一章強調 FPGA 在各種影像處理和生物醫學應用中的使用。接下來的第二至第五章則從 HDL 的角度闡述數位設計的基本理解。第六和第七章專注於使用替代材料或幾何形狀來提升基於矽的 FET 設計的性能。第八和第九章描述了與生物感測 FET 相關的雙分子相互作用的研究。第十至第十三章處理各種形狀和材料（如納米線、HFET）的先進 FET 結構及其在設備性能指標計算方面的比較。第十四至第十八章描述了針對類比和數位電路設計的不同應用特定 VLSI 設計技術和挑戰。第十九章解釋了 VLSI 測試性問題，並描述了使用 Verilog HDL 進行測試模式生成的模擬及其分類為邏輯和故障模擬。第二十章則處理通過隱藏 IC 的結構和功能來實現安全的 VLSI 設計，這使得逆向工程變得更加困難。
作者簡介
Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc.
Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.
作者簡介(中文翻譯)
Suman Lata Tripathi 目前擔任印度旁遮普邦 Phagwara 的 Lovely Professional University 教授，擁有超過十七年的學術經驗。她的專業領域包括微電子裝置建模與特性分析、低功耗 VLSI 電路設計、針對物聯網 (IoT) 和生醫應用的 VLSI 測試設計及先進 FET 設計等。
Sobhit Saxena 是印度旁遮普邦 Phagwara 的 Lovely Professional University 副教授。他的專業領域包括奈米材料的合成與特性分析、電化學分析，以及基於 CNT 的 VLSI 電路互連的建模與模擬。
S. K. Mohapatra 在 Bhubaneswar 的 Kalinga Institute of Industrial Technology 電子工程學院擔任助理教授。他的研究興趣包括奈米尺度裝置的建模與模擬及其在物聯網 (IoT) 中的應用、節能無線感測網路、臨時網路、行動通信、在 THz 應用中的超材料吸收器、UWB-MIMO 天線、可重構天線，以及高頻性能增強。
