Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Du, Xiong, Zhang, Jun, Li, Gaoxian

  • 出版商: Springer
  • 出版日期: 2022-07-09
  • 售價: $6,140
  • 貴賓價: 9.5$5,833
  • 語言: 英文
  • 頁數: 172
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 9811931313
  • ISBN-13: 9789811931314
  • 相關分類: 半導體
  • 海外代購書籍(需單獨結帳)

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作者簡介

Xiong Du obtained his B.S., M.S., and Ph. D. degrees from Chongqing University, China in 2000, 2002, and 2005 respectively, all in the Electrical Engineering. He has been with Chongqing University since 2002 and is currently a full professor in the School of Electrical Engineering, Chongqing University. He was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY from July 2007 to July 2008. His research interests include power electronics system reliability and stability. He is a recipient of the National Excellent Doctoral Dissertation of P.R. China in 2008.
Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.

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