LabVIEW based Automation Guide for Microwave Measurements (SpringerBriefs in Electrical and Computer Engineering)
暫譯: 基於LabVIEW的微波測量自動化指南(電氣與計算機工程SpringerBriefs系列)
Satya Kesh Dubey
- 出版商: Springer
- 出版日期: 2017-10-14
- 售價: $2,200
- 貴賓價: 9.5 折 $2,090
- 語言: 英文
- 頁數: 60
- 裝訂: Paperback
- ISBN: 981106279X
- ISBN-13: 9789811062797
-
相關分類:
LabVIEW、微波工程 Microwave
海外代購書籍(需單獨結帳)
相關主題
商品描述
The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC).
商品描述(中文翻譯)
本書專注於測量自動化,特別是使用 LabView 工具。它以簡化的方式解釋基本測量,並提供適當的逐步說明和儀器能力的討論。書中涉及測量科學、微波測量以及測量軟體開發的各個方面。本書可作為技術人員、研究人員和科學家在計量實驗室中自動化測量的指南。書中解釋了測量系統自動化的開發過程,涵蓋了軟體開發生命週期的每一個步驟,包括系統設計和自動化政策的制定。本書採用自上而下的方法,使讀者能夠將自己的問題與系統相關聯,並根據自己的分析開發系統。書中包含許多範例、插圖、流程圖、測量結果以及微波測量自動化軟體的截圖。書中還討論了微波測量的衰減、微波功率和電場強度。本書的內容將吸引在電磁學、天線、通信以及電磁干擾/電磁相容性(EMI/EMC)領域工作的學生、研究人員和科學家。