Efficient Test Methodologies for High-Speed Serial Links (Lecture Notes in Electrical Engineering)
暫譯: 高效的高速串行連結測試方法學(電氣工程講義)

Dongwoo Hong

  • 出版商: Springer
  • 出版日期: 2012-03-01
  • 售價: $7,600
  • 貴賓價: 9.5$7,220
  • 語言: 英文
  • 頁數: 112
  • 裝訂: Paperback
  • ISBN: 9400730942
  • ISBN-13: 9789400730946
  • 海外代購書籍(需單獨結帳)

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商品描述

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

商品描述(中文翻譯)

《高效能高速串列連結測試方法論》詳細描述了幾種新穎且有前景的技術,這些技術能以具成本效益的方式對高速介面進行高測試覆蓋率的測試。《高效能高速串列連結測試方法論》的主要重點在於對抖動(jitter)和位元錯誤率(bit-error-rate, BER)的高效測試方法,這些方法廣泛用於量化通訊系統的品質。文中呈現了各種分析及實驗結果,以證明所提出技術的有效性。