Fault Analysis in Cryptography (Hardcover)
暫譯: 密碼學中的故障分析 (精裝版)

Marc Joye, Michael Tunstall

  • 出版商: Springer
  • 出版日期: 2012-06-22
  • 售價: $4,160
  • 貴賓價: 9.5$3,952
  • 語言: 英文
  • 頁數: 356
  • 裝訂: Hardcover
  • ISBN: 3642296556
  • ISBN-13: 9783642296550
  • 相關分類: 資訊安全
  • 海外代購書籍(需單獨結帳)

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商品描述

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks. Preventing fault attacks without sacrificing performance is nontrivial and this is the subject of this book. Part I deals with side-channel analysis and its relevance to fault attacks. The chapters in Part II cover fault analysis in secret key cryptography, with chapters on block ciphers, fault analysis of DES and AES, countermeasures for symmetric-key ciphers, and countermeasures against attacks on AES. Part III deals with fault analysis in public key cryptography, with chapters dedicated to classical RSA and RSA-CRT implementations, elliptic curve cryptosystems and countermeasures using fault detection, devices resilient to fault injection attacks, lattice-based fault attacks on signatures, and fault attacks on pairing-based cryptography. Part IV examines fault attacks on stream ciphers and how faults interact with countermeasures used to prevent power analysis attacks. Finally, Part V contains chapters that explain how fault attacks are implemented, with chapters on fault injection technologies for microprocessors, and fault injection and key retrieval experiments on a widely used evaluation board. This is the first book on this topic and will be of interest to researchers and practitioners engaged with cryptographic engineering.

商品描述(中文翻譯)

在1970年代,研究人員注意到包裝材料中自然存在的元素所產生的放射性粒子可能會導致電子晶片敏感區域的位元翻轉。對宇宙射線對半導體影響的研究,這在航空航天產業中特別受到關注,導致了針對惡劣環境設計的電子設備的加固方法。最終,發現了各種故障產生和傳播的機制,特別是注意到許多加密演算法容易受到所謂的故障攻擊。防止故障攻擊而不犧牲性能並非易事,這正是本書的主題。第一部分探討側信道分析及其與故障攻擊的相關性。第二部分的章節涵蓋了秘密金鑰加密中的故障分析,包括區塊加密、DES和AES的故障分析、對稱金鑰加密的對策,以及針對AES攻擊的對策。第三部分探討公鑰加密中的故障分析,章節專注於經典的RSA和RSA-CRT實現、橢圓曲線密碼系統以及使用故障檢測的對策、對故障注入攻擊具有韌性的設備、基於格的簽名故障攻擊,以及對配對基礎加密的故障攻擊。第四部分檢視對流加密的故障攻擊,以及故障如何與用於防止功率分析攻擊的對策互動。最後,第五部分包含解釋故障攻擊如何實施的章節,包括微處理器的故障注入技術,以及在廣泛使用的評估板上的故障注入和金鑰檢索實驗。這是該主題的第一本書,將吸引從事加密工程的研究人員和實務工作者的興趣。