Reliability Physics and Engineering: Time-To-Failure Modeling Third Edition
暫譯: 可靠性物理與工程：失效時間建模 第三版
McPherson, J. W.
- 出版商: Springer
- 出版日期: 2019-01-10
- 售價: $4,800
- 貴賓價: 9.5 折 $4,560
- 語言: 英文
- 頁數: 463
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3319936824
- ISBN-13: 9783319936826
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相關分類:
物理學 Physics
海外代購書籍(需單獨結帳)
商品描述
This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes-- all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
商品描述(中文翻譯)
這本第三版教科書提供了電機工程師、機械工程師、土木工程師、生醫工程師、材料科學家和應用物理學家所需的可靠性物理學和工程學基礎知識，以幫助他們建造更好的設備/產品。書中所包含的信息應該能幫助所有工程領域發展出更好的方法論，以實現：更可靠的產品設計、更可靠的材料選擇和更可靠的製造過程——這些都應有助於提高產品的可靠性。需要具備微分方程的數學水平。此外，假設讀者對使用 Excel 試算表有一定的熟悉度。任何所需的統計訓練和工具均包含在文本中。儘管設備故障是一個統計過程（因此統計學很重要），但本書的重點顯然是在故障的物理學以及開發在設備設計和設備製造階段所需的可靠性工程工具，以促進產品改進。
作者簡介
J.W. McPherson is recognized internationally as an expert in Reliability Physics & Engineering. He has published over 200 papers on reliability, authored the Reliability Chapters for 4 Books, awarded 15 patents, and holds the title of Texas Instruments Senior Fellow Emeritus. He was the 1995 General Chairman of the IEEE International Reliability Physics Symposium and still serves on its Board of Directors. In 2004, Joe received the IEEE Engineer of the Year Award from the Texas Society of Professional Engineers. In 2006, he was the Chairman of the International Sematech Reliability Council. Joe is an IEEE Fellow and the Founder/CEO of McPherson Reliability Consulting, LLC. His semiconductor reliability expertise includes device-physics, design-in reliability, wafer-fabrication and assembly-related reliability issues. Several of the reliability models that are used today in the semiconductor industry are closely associated with his name.
作者簡介(中文翻譯)
J.W. McPherson 在可靠性物理與工程領域被國際公認為專家。他已發表超過 200 篇有關可靠性的論文，為 4 本書撰寫了可靠性章節，獲得 15 項專利，並擔任德州儀器 (Texas Instruments) 的資深研究員名譽職位。他曾於 1995 年擔任 IEEE 國際可靠性物理研討會的總主席，並持續擔任其董事會成員。2004 年，Joe 獲得德州專業工程師協會頒發的 IEEE 年度工程師獎。2006 年，他擔任國際 Sematech 可靠性委員會的主席。Joe 是 IEEE 會士，也是 McPherson Reliability Consulting, LLC 的創辦人兼執行長。他在半導體可靠性方面的專業知識包括裝置物理、設計可靠性、晶圓製造及組裝相關的可靠性問題。當前半導體產業中使用的幾個可靠性模型與他的名字密切相關。
