Deep Learning for Advanced X-Ray Detection and Imaging Applications
暫譯: 深度學習在高級X光檢測與影像應用中的應用
Iniewski, Cai
- 出版商: Springer
- 出版日期: 2025-01-23
- 售價: $5,100
- 貴賓價: 9.5 折 $4,845
- 語言: 英文
- 頁數: 261
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 3031756525
- ISBN-13: 9783031756528
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相關分類:
DeepLearning
海外代購書籍(需單獨結帳)
商品描述
This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.
商品描述(中文翻譯)
本書提供了最新人工智慧（Artificial Intelligence, AI）在先進X光影像應用方面的全面概述，特別著重於其醫療應用。讀者將了解為何AI將徹底改變傳統的信號處理和影像重建，並顯著提升性能。作者闡述了機器學習（Machine Learning, ML）和深度學習（Deep Learning, DL）如何顯著推進X光檢測分析、影像重建及其他關鍵步驟。本書還揭示了這些技術如何使基於光子計數探測器的X光電腦斷層掃描（Computed Tomography, CT）成為可能，這不僅有潛力改善當前的CT影像，還能啟用新的臨床應用，例如提供更高的空間解析度、更好的軟組織對比、K邊緣影像以及同時多對比劑影像。
作者簡介
Krzysztof (Kris) Iniewski is director of development architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 20 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto.
Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 35+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
Liang (Kevin) Cai is Manager of CT Reconstruction at Canon Medical Research USA. During his time at Canon, Dr. Cai managed several industry leading DeepLearning CT reconstruction algorithm development, including Advanced intelligent Clear-IQ Engine (AiCE), Precise IQ Engine (PIQE), and Deep Learning Spectral CT. Dr. Cai has extensive experience in X-ray and Gamma-ray imaging systems development, with broad expertise in both detection physics and reconstruction algorithms. Dr. Cai has published 50+ research papers in international journals and conferences. He is also a named inventor for 20+ granted US patents.
作者簡介(中文翻譯)
Krzysztof (Kris) Iniewski 是位於加拿大不列顛哥倫比亞省的 Redlen Technologies Inc. 的開發架構與應用總監。在 Redlen 工作的 20 年中，他負責管理醫療影像和安全應用中高度整合的 CdZnTe 探測器產品的開發。在加入 Redlen 之前，Kris 曾在 PMC-Sierra、阿爾伯塔大學、SFU、UBC 和多倫多大學擔任各種管理和學術職位。
Iniewski 博士在國際期刊和會議上發表了超過 150 篇研究論文。他擁有 35 項以上在美國、加拿大、法國、德國和日本授予的國際專利。他為 Wiley、劍橋大學出版社、麥格勞-希爾、CRC Press 和 Springer 編寫和編輯了 75 本以上的書籍。他是經常受邀的演講者，並為多個國際組織提供諮詢服務。
Liang (Kevin) Cai 是佳能醫療研究美國的 CT 重建經理。在佳能工作期間，Cai 博士管理了幾個行業領先的深度學習 CT 重建演算法的開發，包括先進智能 Clear-IQ 引擎 (AiCE)、精確 IQ 引擎 (PIQE) 和深度學習光譜 CT。Cai 博士在 X 射線和伽馬射線影像系統開發方面擁有豐富的經驗，並在檢測物理學和重建演算法方面具有廣泛的專業知識。Cai 博士在國際期刊和會議上發表了 50 篇以上的研究論文。他也是 20 項以上美國專利的命名發明人。
