Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
  • 出版商: Springer
  • 出版日期: 2024-02-07
  • 售價: $3,780
  • 貴賓價: 9.5 折 $3,591
  • 語言: 英文
  • 頁數: 366
  • 裝訂: Hardcover - also called cloth, retail trade, or trade
  • ISBN: 3031442326
  • ISBN-13: 9783031442322

    • 海外代購書籍(需單獨結帳)

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商品描述

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists.

商品描述(中文翻譯)

從精密儀器的角度出發，本書為讀者提供了一個導覽，探索原子力顯微鏡（AFM）的內部運作。圍繞著AFM，涵蓋了廣泛的機電系統主題，包括機械、感測器、致動器、傳動設計、系統識別、信號處理、動態系統建模和控制器。在堅實的理論基礎上，提供了AFM子系統級設計的實際示例，包括納米定位系統、懸臂探針、控制系統和系統集成。本書強調了具有嵌入式傳感器的主動懸臂探針的新開發，這使得AFM能夠應用於先進應用。提供了一個低成本的教育用AFM和一個規模模型互動學習擴展現實（SMILER）工具包的完整設計細節，幫助教師利用本書進行課程開發。本書旨在使AFM用戶更深入地了解儀器，以擴展AFM在先進的最新研究中的功能。超越AFM，本書中介紹的材料廣泛適用於許多機械和電氣工程高級研究生課程中涵蓋的精密機電系統設計，以培養下一代儀器專家。

作者簡介

Fangzhou Xia is a Research Scientist, jointly appointed in the of Mechanical Engineering Department and Physics Department at the Massachusetts Institute of Technology. He received his Ph.D. in Mechanical Engineering from Massachusetts Institute of Technology (MIT), Cambridge, MA, USA, in 2020. His research interests include precision mechatronics, physical/computational intelligence, controls, nano-robotics, and instrumentation with applications in scanning probe microscopy, biomedical devices, and industrial automation.

Dr. Ivo W. Rangelow is a University Professor in the Production and Precision Metrology Department at Ilmenau University of Technology. He received his Ph.D. with "summa cum laude" from Wroclaw University of Technology, Poland, in 1982. His research interests include nanofabrication, semiconductor devices, vacuum microelectronics, embedded systems, transducer technology, and scanning probe sciences.

Dr. Kamal Youcef-Toumiis a Professor in the Department of Mechanical Engineering at the Massachusetts Institute of Technology. He received his Sc.D. degree in Mechanical Engineering from the Massachusetts Institute of Technology (MIT), Cambridge, MA, USA, in 1985. His research interests include modeling, design, instrumentation, control theory and their applications to dynamic systems.

作者簡介(中文翻譯)

Fangzhou Xia是麻省理工學院機械工程系和物理系的研究科學家。他於2020年在美國麻省理工學院獲得機械工程博士學位。他的研究興趣包括精密機電技術、物理/計算智能、控制、納米機器人和儀器儀表，並應用於掃描探針顯微術、生物醫學設備和工業自動化。

Dr. Ivo W. Rangelow是伊爾梅瑙工業大學生產和精密測量系的大學教授。他於1982年在波蘭弗羅茲瓦夫工業大學獲得博士學位，並以優異成績畢業。他的研究興趣包括納米製造、半導體器件、真空微電子、嵌入式系統、傳感器技術和掃描探針科學。

Dr. Kamal Youcef-Toumi是麻省理工學院機械工程系的教授。他於1985年在美國麻省理工學院獲得機械工程博士學位。他的研究興趣包括建模、設計、儀器儀表、控制理論及其在動態系統中的應用。

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