Photon Counting Computed Tomography: Clinical Applications, Image Reconstruction and Material Discrimination
Hsieh, Scott, Iniewski
- 出版商: Springer
- 出版日期: 2024-05-28
- 售價: $2,520
- 貴賓價: 9.5 折 $2,394
- 語言: 英文
- 頁數: 277
- 裝訂: Quality Paper - also called trade paper
- ISBN: 3031260643
- ISBN-13: 9783031260643
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作者簡介
Scott Hsieh is an assistant professor at the Mayo Clinic whose research includes modeling and development of photon counting detectors. His past contributions to photon counting include theory for circuit designs that could reduce dose and improve contrast, and simulations to define application requirements. Previously, he was a faculty member at UCLA and an instructor at Stanford. He is a named inventor on 13 issued U.S. utility patents.
Krzysztof (Kris) Iniewski is a director of detector architecture and applications at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 16 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. He has published over 150+ research papers in international journals and conferences. He holds 25+international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer.作者簡介(中文翻譯)
Scott Hsieh是Mayo Clinic的助理教授,他的研究包括光子計數探測器的建模和開發。他在光子計數方面的過去貢獻包括用於減少劑量和改善對比度的電路設計理論,以及定義應用需求的模擬。在此之前,他曾是UCLA的教職員,也曾在斯坦福擔任教師。他是13項美國實用專利的命名發明人。
Krzysztof(Kris)Iniewski是位於加拿大不列顛哥倫比亞省的探測器公司Redlen Technologies Inc.的探測器架構和應用主管。在Redlen的16年裡,他負責管理醫學影像和安全應用中高度集成的CZT探測器產品的開發。在Redlen之前,Kris在PMC-Sierra、阿爾伯塔大學、SFU、UBC和多倫多大學擔任各種管理和學術職位。他在國際期刊和會議上發表了150多篇研究論文。他擁有在美國、加拿大、法國、德國和日本授予的25多項國際專利。他還為Wiley、劍橋大學出版社、麥格勞希爾、CRC出版社和Springer編寫和編輯了75多本書籍。