Advancements in Optical Methods, Digital Image Correlation & Micro-And Nanomechanics, Volume 4: Proceedings of the 2022 Annual Conference on Experimen

Lin, Ming-Tzer, Furlong, Cosme, Hwang, Chi-Hung

  • 出版商: Springer
  • 出版日期: 2024-02-12
  • 售價: $9,640
  • 貴賓價: 9.5$9,158
  • 語言: 英文
  • 頁數: 81
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 3031174739
  • ISBN-13: 9783031174735
  • 海外代購書籍(需單獨結帳)

相關主題

商品描述

Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:

DIC Methods & Its Applications

Photoelsticity and Interferometry Applications

Micro-Optics and Microscopic Systems

Multiscale and New Developments in Optical Methods

Extreme Nanomechanics

In-Situ Nanomechanics

Expanding Boundaries in Metrology

Micro and Nanoscale Deformation

MEMS for Actuation, Sensing and Characterization

1D & 2D Materials


商品描述(中文翻譯)

《光學方法、數位影像相關性與微觀及納米力學的進展》,為《2022年SEM年會暨實驗與應用力學博覽會論文集》第四卷,共六卷,匯集了對這一重要研究與工程領域的貢獻。該文集展示了早期的研究結果和案例研究,涵蓋了從傳統的光彈性和干涉測量到較新型的數位影像相關性(DIC)和數位變形相關性(DVC)技術的各種光學方法,並包括以下一般技術研究領域的論文:

DIC方法及其應用
光彈性和干涉測量應用
微光學和微觀系統
光學方法中的多尺度與新發展
極端納米力學
原位納米力學
計量學的邊界擴展
微觀和納米尺度變形
用於驅動、感測和特徵化的MEMS
一維與二維材料

作者簡介

Ming-Tzer Lin - National Chung Hsing University, Taiwan; Cosme Furlong - Worcester Polytechnic Institute, USA; Chi-Hung Hwang-Instrument Technology Research Center, Taiwan; Mohammad Naraghi, Texas A&M University, USA; Frank DelRio, National Institutes of Standards and Technology, Boulder, CO, USA

作者簡介(中文翻譯)

林名澤 - 國立中興大學,台灣;Cosme Furlong - 伍斯特理工學院,美國;黃志宏 - 儀器技術研究中心,台灣;Mohammad Naraghi - 德州農工大學,美國;Frank DelRio - 美國國家標準與技術研究院,科羅拉多州博爾德。