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商品描述
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
商品描述(中文翻譯)
《微電子測試結構於CMOS技術與產品》探討了測試結構設計的基本概念，以便整合於測試載具、劃線區和CMOS產品中。隨著開發和製造成本及複雜性的增加，測試結構在CMOS技術和產品的開發與監控中的角色變得越來越重要。在這本及時的著作中，IBM科學家Manjul Bhushan和Mark Ketchen強調了數位CMOS電路應用的高速特性化技術，以及電路性能與MOSFET及其他電路元件特性之間的橋接。全書提供了詳細的範例，其中許多同樣適用於其他微電子技術。作者的總體目標是為學生和技術從業者提供一個實用指南，幫助他們有條不紊地設計和使用測試結構，從而提供有關數位CMOS技術的參數和性能的明確資訊。
