Nonvolatile Memory Design: Magnetic, Resistive, and Phase Change
暫譯: 非揮發性記憶體設計:磁性、電阻性與相變化
Li, Hai, Chen, Yiran
- 出版商: CRC
- 出版日期: 2017-03-29
- 售價: $4,400
- 貴賓價: 9.5 折 $4,180
- 語言: 英文
- 頁數: 203
- 裝訂: Quality Paper - also called trade paper
- ISBN: 1138076635
- ISBN-13: 9781138076631
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商品描述
The manufacture of flash memory, which is the dominant nonvolatile memory technology, is facing severe technical barriers. So much so, that some emerging technologies have been proposed as alternatives to flash memory in the nano-regime. Nonvolatile Memory Design: Magnetic, Resistive, and Phase Changing introduces three promising candidates: phase-change memory, magnetic random access memory, and resistive random access memory. The text illustrates the fundamental storage mechanism of these technologies and examines their differences from flash memory techniques. Based on the latest advances, the authors discuss key design methodologies as well as the various functions and capabilities of the three nonvolatile memory technologies.
商品描述(中文翻譯)
快閃記憶體的製造,作為主導的非揮發性記憶體技術,正面臨嚴重的技術障礙。甚至有一些新興技術被提出作為納米範疇中快閃記憶體的替代方案。《非揮發性記憶體設計:磁性、電阻性和相變化》介紹了三種有前景的候選技術:相變化記憶體、磁性隨機存取記憶體和電阻性隨機存取記憶體。該文本闡述了這些技術的基本儲存機制,並檢視它們與快閃記憶體技術的差異。根據最新的進展,作者討論了關鍵的設計方法論以及這三種非揮發性記憶體技術的各種功能和能力。