Fundamentals of Infrared and Visible Detector Operation and Testing, 2/e(Hardcover)
暫譯: 紅外線與可見光探測器操作與測試基礎,第2版(精裝本)
John David Vincent, Steve Hodges, John Vampola, Mark Stegall, Greg Pierce
- 出版商: Wiley
- 出版日期: 2015-11-09
- 售價: $5,300
- 貴賓價: 9.5 折 $5,035
- 語言: 英文
- 頁數: 584
- 裝訂: Hardcover
- ISBN: 1118094883
- ISBN-13: 9781118094884
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商品描述
Presents a comprehensive introduction to the selection, operation, and testing of infrared devices, including a description of modern detector assemblies and their operation This book discusses how to use and test infrared and visible detectors. The book provides a convenient reference for those entering the field of IR detector design, test or use, those who work in the peripheral areas, and those who teach and train others in the field. Chapter 1 contains introductory material. Radiometry is covered in Chapter 2. The author examines Thermal detectors in Chapter 3; the Classical photon detectors simple photoconductors and photovoltaics in Chapter 4; and Modern Photon Detectors in Chapter 5. Chapters 6 through 8 consider respectively individual elements and small arrays of elements the readouts (ROICs) used with large imaging arrays; and Electronics for FPA Operation and Testing. The Test Set and The Testing Process are analyzed in Chapters 9 and 10, with emphasis on uncertainty and trouble shooting. Chapters 11 through 15 discuss related skills, such as Uncertainty, Cryogenics, Vacuum, Optics, and the use of Fourier Transforms in the detector business. Some highlights of this new edition are that it * Discusses radiometric nomenclature and calculations, detector mechanisms, the associated electronics, how these devices are tested, and real-life effects and problems * Examines new tools in Infrared detector operations, specifically: selection and use of ROICs, electronics for FPA operation, operation of single element and very small FPAs, microbolometers, and multi-color FPAs * Contains five chapters with frequently sought-after information on related subjects, such as uncertainty, optics, cryogenics, vacuum, and the use of Fourier mathematics for detector analyses Fundamentals of Infrared and Visible Detector Operation and Testing, Second Edition, provides the background and vocabulary necessary to help readers understand the selection, operation, and testing of modern infrared devices.
商品描述(中文翻譯)
本書全面介紹紅外設備的選擇、操作和測試,包括現代探測器組件及其運作的描述。本書討論如何使用和測試紅外及可見光探測器,為進入紅外探測器設計、測試或使用領域的人士、在相關領域工作的人士,以及教授和訓練他人的人員提供了方便的參考。第一章包含入門材料。第二章涵蓋輻射測量學。作者在第三章探討熱探測器;在第四章介紹經典光子探測器,包括簡單的光導體和光伏元件;在第五章則討論現代光子探測器。第六至八章分別考慮單個元件和小型元件陣列、大型成像陣列所使用的讀出電路(ROICs),以及FPA操作和測試的電子學。第九和第十章分析測試設備和測試過程,重點在於不確定性和故障排除。第十一至十五章討論相關技能,如不確定性、低溫技術、真空、光學,以及傅立葉變換在探測器業務中的應用。本新版本的一些亮點包括:* 討論輻射測量學的命名法和計算、探測器機制、相關電子學、這些設備的測試方法,以及實際效果和問題 * 檢視紅外探測器操作中的新工具,特別是:ROICs的選擇和使用、FPA操作的電子學、單元件和非常小的FPA的操作、微熱計和多色FPA * 包含五章有關不確定性、光學、低溫技術、真空以及傅立葉數學在探測器分析中的應用等相關主題的常見資訊。《紅外和可見光探測器操作與測試基礎(第二版)》提供了幫助讀者理解現代紅外設備的選擇、操作和測試所需的背景和詞彙。