Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
暫譯: 先進材料特性分析：基本原則、新穎應用與未來方向

Kumar, Ch Sateesh, Singh, M. Muralidhar, Krishna, Ram

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
  • 出版商: CRC
  • 出版日期: 2024-11-29
  • 售價: $2,400
  • 貴賓價: 9.5 折 $2,280
  • 語言: 英文
  • 頁數: 130
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 1032375116
  • ISBN-13: 9781032375113

    • 海外代購書籍(需單獨結帳)

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商品描述

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

商品描述(中文翻譯)

本書涵蓋了工程中常用的先進材料的各種特性表徵方法，包括對設備工作原理和適用性的理解。主要介紹的儀器包括X射線衍射（X-Ray Diffraction）、近場光學顯微鏡拉曼光譜（NSOM Raman）、X射線光電子能譜（X-Ray Photo Spectroscopy）、紫外-可見-近紅外光譜儀（UV-VIS-NIR Spectrosphotometer）、傅立葉變換紅外光譜（FTIR Spectroscopy）等。

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