Pragmatic Unit Testing in C# with NUnit, 2/e (Paperback)
暫譯: C# 與 NUnit 實用單元測試，第 2 版 (平裝本)

Andy Hunt, Dave Thomas, Matt Hargett

Pragmatic Unit Testing in C# with NUnit, 2/e (Paperback)

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商品描述

Book Description

The NIST estimates that poor testing costs the US economy $60 billion annually. This book gives teams straightforward and proven ways to introduce unit testing into their process, resulting in higher quality and fewer bugs.

All over the world, software teams are using unit testing both to verify their code and as a way of helping them design better code. This book is unique in the way it covers two aspects: showing developers both how to test and helping them determine what to test.

New in the second edition:

  • Updated for NUnit 2.4 (.NET 2.0 and Visual Studio 2005)
  • More assert methods
  • New String and Collection assertion support
  • Better support for multiple-platform development
  • Higher-level setup and teardown fixtures
  • Whole new chapter on extending NUnit
  • and more!

 

商品描述(中文翻譯)

書籍描述

NIST估計，測試不良每年使美國經濟損失600億美元。本書為團隊提供了簡單且經過驗證的方法，將單元測試引入其流程，從而提高質量並減少錯誤。

在全球範圍內，軟體團隊使用單元測試來驗證其代碼，並幫助他們設計更好的代碼。本書的獨特之處在於它涵蓋了兩個方面：向開發人員展示如何進行測試，並幫助他們確定測試的內容。

第二版的新內容：

- 更新至NUnit 2.4（.NET 2.0和Visual Studio 2005）
- 更多的斷言方法
- 新增字串和集合的斷言支援
- 更好的多平台開發支援
- 更高層次的設置和拆卸固定裝置
- 全新章節：擴展NUnit
- 還有更多！

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