Thermal-Aware Testing of Digital VLSI Circuits and Systems
暫譯: 數位 VLSI 電路與系統的熱感知測試

The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips.