Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements

Iniewski, Krzysztof, Iwanczyk, Jan S.

Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements
  • 出版商: CRC
  • 出版日期: 2024-05-27
  • 售價: $2,370
  • 貴賓價: 9.5 折 $2,252
  • 語言: 英文
  • 頁數: 323
  • 裝訂: Quality Paper - also called trade paper
  • ISBN: 0367707179
  • ISBN-13: 9780367707170
  • 相關分類: 感測器 Sensor

    • 海外代購書籍(需單獨結帳)

相關主題

商品描述

The book puts emphasis on sensor materials, detector structures, front electronics technology and their designs as well as system optimization for different applications. Also, it includes characterization measurements of the developed detection systems.

商品描述(中文翻譯)

這本書著重於感測器材料、檢測器結構、前端電子技術及其設計，以及不同應用的系統優化。此外，它還包括對所開發的檢測系統進行的特性測量。

作者簡介

Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017.

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.

作者簡介(中文翻譯)

Jan Iwanczyk自2017年7月起擔任大學和私營公司的顧問。他曾在2005年至2017年擔任加利福尼亞州北里奇的DxRay公司的總裁兼首席執行官。

Krzysztof (Kris) Iniewski目前在位於加拿大不列顛哥倫比亞省的探測器公司Redlen Technologies Inc.擔任研發開發活動的管理工作。在Redlen的15年期間，他負責開發醫學影像和安全應用中高度集成的CZT探測器產品。

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