Measurements-Based Radar Signature Modeling: An Analysis Framework
Mayhan, Joseph T., Tabaczynski, John A.
- 出版商: MIT
- 出版日期: 2024-05-14
- 售價: $4,250
- 貴賓價: 9.5 折 $4,038
- 語言: 英文
- 頁數: 512
- 裝訂: Hardcover - also called cloth, retail trade, or trade
- ISBN: 0262048116
- ISBN-13: 9780262048118
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作者簡介
Joseph T. Mayhan is a Senior Staff Member at MIT Lincoln Laboratory, where he has worked for fifty years, formerly as Group Leader of the Sensor Systems and Measurements Group.
The late John A. Tabaczynski served as Assistant, Associate, and then Leader of the Ballistic Missile Defense Analysis division at MIT Lincoln Laboratory, where he worked for over fifty years.
The late John A. Tabaczynski served as Assistant, Associate, and then Leader of the Ballistic Missile Defense Analysis division at MIT Lincoln Laboratory, where he worked for over fifty years.
作者簡介(中文翻譯)
Joseph T. Mayhan 是麻省理工學院林肯實驗室的高級職員,他在該實驗室工作了五十年,曾擔任感測系統與測量組的組長。已故的 John A. Tabaczynski 曾擔任麻省理工學院林肯實驗室彈道導彈防禦分析部門的助理、協理,然後成為部門負責人,他在該實驗室工作了超過五十年。