An Introduction to Mixed-Signal IC Test and Measurement, 2/e (Hardcover)
暫譯: 混合信號集成電路測試與測量導論(第二版,精裝本)

Gordon Roberts, Friedrich Taenzler, Mark Burns

  • 出版商: Oxford University
  • 出版日期: 2011-10-14
  • 售價: $10,280
  • 貴賓價: 9.5$9,766
  • 語言: 英文
  • 頁數: 864
  • 裝訂: Hardcover
  • ISBN: 0199796211
  • ISBN-13: 9780199796212
  • 無法訂購

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商品描述

With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.

An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.

New to This Edition
* A new chapter on RF Test Methods and Fundamentals of RF Testing
* A new chapter on Clock and Serial Data Communications Channel Measurements
* Coverage of RF load board design
* New coverage of probabilistic reasoning for mixed-signal testing

商品描述(中文翻譯)

隨著包含數位、類比、混合信號和射頻電路的複雜半導體設備的普及,當今的工程師必須精通這四種電路類型。本書《混合信號集成電路測試與測量導論》(第二版)是為高年級本科生、研究生以及工程專業人士所撰寫,涵蓋了類比、混合信號和射頻電路的測試,並提供了許多相關的工業範例。該文本假設讀者具備堅實的類比和數位電路背景,以及計算機和計算機程式設計的工作知識。

《混合信號集成電路測試與測量導論》(第二版)包含了示例和插圖,展示最先進的工業技術,以豐富和活化文本。該書還介紹了大規模混合信號電路和單個電路的測試,討論了混合信號集成電路測試對製造商產品的增值好處,並明確定義了測試工程師的角色。

本版新增內容:
* 新增一章關於射頻測試方法和射頻測試基礎
* 新增一章關於時鐘和串行數據通信通道測量
* 涵蓋射頻負載板設計
* 新增混合信號測試的概率推理相關內容