Semiconductor Manufacturing Handbook
暫譯: 半導體製造手冊
Hwaiyu Geng
- 出版商: McGraw-Hill Education
- 出版日期: 2005-05-01
- 售價: $6,000
- 貴賓價: 9.5 折 $5,700
- 語言: 英文
- 頁數: 800
- 裝訂: Hardcover
- ISBN: 0071445595
- ISBN-13: 9780071445597
-
相關分類:
半導體
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商品描述
Description:
This handbook will provide engineers with the principles, applications, and solutions needed to design and manage semiconductor manufacturing operations. Consolidating the many complex fields of semiconductor fundamentals and manufacturing into one volume by deploying a team of world class specialists, it allows the quick look up of specific manufacturing reference data across many subdisciplines.
Table of Contents:
PART 1: Semiconductor Fundamentals and Basic Materials
OARD OF REVIEWERS
CONTRIBUTORS
PREFACE
ACKNOWLEDGMENTS
Chapter 1: How Semiconductor Chips Are Made - Hwaiyu Geng, Lin Zhou
Chapter 2: IC Design - Ilsun Park
Chapter 3: Silicon Substrates for Semiconductor Manufacturing - K.V. Ravi
Chapter 4: Copper, Low-k Dielectrics, and Their Reliability - Hazara S. Rathore, Kaushik Chanda
Chapter 5: Fundamentals-Silicide Formation on Si - L.P. Ren, King N. Tu
Chapter 6: Plasma Process Control - David J. Coumou
Chapter 7: Vacuum Technology - Peter Biltoft
Charles Howard
PART 2: Wafer Processing
Chapter 9: Microlithography - Chris A. Mack
Chapter 10: Ion Implanation and Rapid Thermal Processing - Michael Graf
Chapter 11: Wet Etching - Peng Zhang
Chapter 12: Plasma Etching - Shouliang Lai
Chapter 13: Physical Vapor Deposition - Florian Solzbacher
Chapter 14: Chemical Vapor Deposition - Edward J. McInerney
Chapter 15: Epitaxy - Jamal Ramdani, Giovanni Vaccari
Chapter 16: ECD Fundamentals - Tom Ritzdorf, John Klocks
Chapter 17: Chemical Mechanical Planarization - Timothy S. Dyer
Chapter 18: Wet Cleaning - Andrew Machamer
Part 3: Final Manufacturing
Chapter 19: Inspection, Measurement, and Test - Donald W. Blair
Chapter 20: Grinding, Stress Relief, and Dicing - Kazuhisa Arai, Yoshikazu Kobayashi, Hideaki Otani
Chapter 21: Packaging - Dietrich Tonnies, Michael Topper
Part 4: Nanotechnology, MEMS, and FPD
Chapter 22: Nanotechnology and Nanomanufacturing - Zhong L. Wang
Chapter 23: Fundamentals of Microelectromechanical Systems - Michael A. Huff
Chapter 24: Flat-Panel Display Technology and Manufacturing - David N. Liu
Part 5: Gases and Chemicals
Chapter 25: Specialty Gas and CDA Systems - Wayne D. Curcie
Chapter 26: Waste Gas Abatement Systems - Joseph D. Sweeney
Chapter 27: PFC Abatement - James C. Cox
Chapter 28: Chemical and Slurry Handling Systems - Kristin Cavicchi, Dan Barsness
Chapter 29: Fluid Handling Components for High Purity Liquid Chemicals and Slurries - Charles K. Gould
Chapter 30: Fundamentals of Ultrapure Water - David J. Albrecht
Part 6: Fab Yield, Operations, and Facilities
Chapter 31: Yield Management - Bo Li, Wayne Carriker
Chapter 32: Automated Material Handling System - Clint Harris
Chapter 33: CD Metrology and CD-SEM - Ram Peltinov, Mina Menaker
Chapter 34: Six Sigma - Bruno Scibilia, Yoan Dupret
Chapter 35: Advanced Process Control - Robert H. McCafferty
Chapter 36: Environmental, Health, and Safety (EHS) Considerations in Semiconductor Fabrication Facilities - Brett J. Davis, Steven R. Trammell
Chapter 37: Plan, Design, and Construction of a FAB - Industrial Design and Construction
Chapter 38: Cleanroom Design and Construction - Richard V. Pavlotsky, Stephen C. Beck
Chapter 39: Micro-Vibration and Noise Design - Michael Gandreau, Hal Amick
Chapter 40: ESD Controls in Cleanroom Environments - Larry Levit
Chapter 41: Airborne Molecular Contamination - Chris Muller
Chapter 42: Particle Monitoring in Semiconductor Manufacturing - Steven Kochevar, Jerry Gromala
Chapter 43: Wastewater Neutralization Systems - Richard E. Pinkowski
APPENDIX
INDEX
商品描述(中文翻譯)
**描述:**
本手冊將為工程師提供設計和管理半導體製造操作所需的原則、應用和解決方案。通過部署一支世界級專家的團隊,將半導體基礎和製造的許多複雜領域整合成一本書,允許快速查找各個子學科的特定製造參考數據。
**目錄:**
第一部分:半導體基礎與基本材料
審查委員會
貢獻者
前言
致謝
第1章:半導體晶片的製造 - *Hwaiyu Geng, Lin Zhou*
第2章:IC設計 - *Ilsun Park*
第3章:半導體製造用矽基板 - *K.V. Ravi*
第4章:銅、低-k介電材料及其可靠性 - *Hazara S. Rathore, Kaushik Chanda*
第5章:基礎 - 矽上的矽化物形成 - *L.P. Ren, King N. Tu*
第6章:等離子體過程控制 - *David J. Coumou*
第7章:真空技術 - *Peter Biltoft*
第8章:光掩模 - *Charles Howard*
第二部分:晶圓處理
第9章:微影技術 - *Chris A. Mack*
第10章:離子植入與快速熱處理 - *Michael Graf*
第11章:濕法蝕刻 - *Peng Zhang*
第12章:等離子體蝕刻 - *Shouliang Lai*
第13章:物理氣相沉積 - *Florian Solzbacher*
第14章:化學氣相沉積 - *Edward J. McInerney*
第15章:外延生長 - *Jamal Ramdani, Giovanni Vaccari*
第16章:ECD基礎 - *Tom Ritzdorf, John Klocks*
第17章:化學機械平坦化 - *Timothy S. Dyer*
第18章:濕清洗 - *Andrew Machamer*
第三部分:最終製造
第19章:檢查、測量與測試 - *Donald W. Blair*
第20章:磨削、應力釋放與切割 - *Kazuhisa Arai, Yoshikazu Kobayashi, Hideaki Otani*
第21章:封裝 - *Dietrich Tonnies, Michael Topper*
第四部分:納米技術、MEMS與平面顯示技術
第22章:納米技術與納米製造 - *Zhong L. Wang*
第23章:微機電系統基礎 - *Michael A. Huff*
第24章:平面顯示技術與製造 - *David N. Liu*
第五部分:氣體與化學品
第25章:特種氣體與CDA系統 - *Wayne D. Curcie*
第26章:廢氣處理系統 - *Joseph D. Sweeney*
第27章:PFC減排 - *James C. Cox*
第28章:化學品與漿料處理系統 - *Kristin Cavicchi, Dan Barsness*
第29章:高純度液體化學品與漿料的流體處理元件 - *Charles K. Gould*
第30章:超純水基礎 - *David J. Albrecht*
第六部分:製造良率、操作與設施
第31章:良率管理 - *Bo Li, Wayne Carriker*
第32章:自動化物料處理系統 - *Clint Harris*
第33章:CD計量與CD-SEM - *Ram Peltinov, Mina Menaker*
第34章:六西格瑪 - *Bruno Scibilia, Yoan Dupret*
第35章:先進過程控制 - *Robert H. McCafferty*
第36章:半導體製造設施中的環境、健康與安全(EHS)考量 - *Brett J. Davis, Steven R. Trammell*
第37章:FAB的計劃、設計與建設 - *工業設計與建設*
第38章:潔淨室的設計與建設 - *Richard V. Pavlotsky, Stephen C. Beck*
第39章:微振動與噪音設計 - *Michael Gandreau, Hal Amick*
第40章:潔淨室環境中的靜電放電控制 - *Larry Levit*
第41章:空氣中分子污染 - *Chris Muller*
第42章:半導體製造中的顆粒監測 - *Steven Kochevar, Jerry Gromala*
第43章:廢水中和系統 - *Richard E. Pinkowski*
附錄
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